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Results:
1-7
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Results: 7
Authors:
El-Hdiy, A
Ziane, D
Citation: A. El-hdiy et D. Ziane, Electric bidirectional stress effects on metal-oxide-silicon capacitors, J APPL PHYS, 89(2), 2001, pp. 1405-1410
Authors:
Ziane, D
Ei-Hdiy, A
Citation: D. Ziane et A. Ei-hdiy, The positive charge neutralisation after bi-directional stress on MOS capacitors, MICROEL REL, 40(4-5), 2000, pp. 759-761
Authors:
Salace, G
Hadjadj, A
Petit, C
Ziane, D
Citation: G. Salace et al., The image force effect on the barrier height in MOS structures: correlation of the corrected barrier height with temperature and the oxide thickness, MICROEL REL, 40(4-5), 2000, pp. 763-766
Authors:
Ziane, D
El-Hdiy, A
Citation: D. Ziane et A. El-hdiy, Positive charge instability during bidirectional stress on metal-oxide-silicon capacitors, J APPL PHYS, 88(11), 2000, pp. 6589-6593
Authors:
El-Hdiy, A
Ziane, D
Nebel, F
Vuillaume, D
Jourdain, M
Citation: A. El-hdiy et al., Dependence of interface-state generation on field polarity in metal-oxide-silicon devices of various thicknesses and technologies, J PHYS D, 32(13), 1999, pp. 1435-1442
Relaxation of positive charge during bidirectional electric stress on metal-oxide-silicon capacitors
Authors:
El-Hdiy, A
Ziane, D
Citation: A. El-hdiy et D. Ziane, Relaxation of positive charge during bidirectional electric stress on metal-oxide-silicon capacitors, J APPL PHYS, 86(11), 1999, pp. 6234-6238
Authors:
Ziane, D
El-Hdiy, A
Salace, G
Citation: D. Ziane et al., Bidirectional stress on a p-metal-oxide-silicon capacitor, J APPL PHYS, 85(9), 1999, pp. 6593-6597
Risultati:
1-7
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