Authors:
Zurbuchen, MA
Lettieri, J
Streiffer, SK
Jia, YF
Hawley, ME
Pan, XQ
Carim, AH
Schlom, DG
Citation: Ma. Zurbuchen et al., Microstructure and electrical properties of epitaxial SrBi2Nb2O9 and SrBi2Ta2O9 films, INTEGR FERR, 33(1-4), 2001, pp. 27-37
Authors:
Zurbuchen, MA
Lettieri, J
Jia, Y
Schlom, DG
Streiffer, SK
Hawley, ME
Citation: Ma. Zurbuchen et al., Transmission electron microscopy study of (103)-oriented epitaxial SrBi2Nb2O9 films grown on (111) SrTiO3 and (111) SrRuO3/(111) SrTiO3, J MATER RES, 16(2), 2001, pp. 489-502
Citation: Ma. Zurbuchen et al., Comment on "High-resolution electron microscopy investigations on stackingfaults in SrBi2Ta2O9 ferroelectric thin films" [Appl. Phys. Lett. 78, 973 (2001)], APPL PHYS L, 79(6), 2001, pp. 887-888
Authors:
Zurbuchen, MA
Jia, YF
Knapp, S
Carim, AH
Schlom, DG
Zou, LN
Liu, Y
Citation: Ma. Zurbuchen et al., Suppression of superconductivity by crystallographic defects in epitaxial Sr2RuO4 films, APPL PHYS L, 78(16), 2001, pp. 2351-2353
Authors:
Lettieri, J
Zurbuchen, MA
Jia, Y
Schlom, DG
Streiffer, SK
Hawley, ME
Citation: J. Lettieri et al., Epitaxial growth of SrBi2Nb2O9 on (110) SrTiO3 and the establishment of a lower bound on the spontaneous polarization of SrBi2Nb2O9, APPL PHYS L, 77(19), 2000, pp. 3090-3092
Citation: Ma. Zurbuchen et Ah. Carim, Strength and microstructure of brazed alumina-silicon carbide ceramic-matrix composites, J AM CERAM, 82(3), 1999, pp. 705-710