Authors:
Siegrist, T
Schneemeyer, LF
van Dover, RB
Waszczak, JV
Citation: T. Siegrist et al., Structural effects of impurities in Ba4Er2Cu7O15-delta: Incorporation of Au and of Al, J SOL ST CH, 150(1), 2000, pp. 228-232
Authors:
Chen, LH
Klemmer, TJ
Ellis, KA
van Dover, RB
Jin, S
Citation: Lh. Chen et al., Soft-magnetic properties of Fe-Co-B thin films for ultra-high-frequency applications, J APPL PHYS, 87(9), 2000, pp. 5858-5860
Authors:
Chen, LH
Shih, YH
Ellis, KA
Jin, S
van Dover, RB
Klemmer, TJ
Citation: Lh. Chen et al., Effect of post-annealing on ultra-high frequency properties of amorphous Fe-Co-B thin films, IEEE MAGNET, 36(5), 2000, pp. 3418-3420