Authors: Rolain, Y Van Moer, W Vandersteen, G van Heijningen, M

Citation: Y. Rolain et al., Measuring mixed-signal substrate coupling, IEEE INSTR, 50(4), 2001, pp. 959-964

Authors: van Heijningen, M Compiet, J Wambacq, P Donnay, S Engels, MGE Bolsens, I

Citation: M. Van Heijningen et al., Analysis and experimental verification of digital substrate noise generation for epi-type substrates, IEEE J SOLI, 35(7), 2000, pp. 1002-1008