Authors: Elefant, D Tietjen, D van Loyen, L Moench, I Schneider, CM

Citation: D. Elefant et al., Dominant role of the size effect for saturation resistivity and giant magnetoresistance in Co/Cu multilayers, J APPL PHYS, 89(11), 2001, pp. 7118-7120

Authors: van Loyen, L Elefant, D Tietjen, D Schneider, CM Hecker, M Thomas, J

Citation: L. Van Loyen et al., Annealing of Ni80Fe20/Cu and Co/Cu multilayers, J APPL PHYS, 87(9), 2000, pp. 4852-4854

Authors: Bruckner, W Baunack, S Hecker, M Monch, JI van Loyen, L Schneider, CM

Citation: W. Bruckner et al., Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices (vol 77, pg 358, 2000), APPL PHYS L, 77(7), 2000, pp. 1064-1064

Authors: Bruckner, W Baunack, S Hecker, M Monch, JI van Loyen, L Schneider, CM

Citation: W. Bruckner et al., Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices, APPL PHYS L, 77(3), 2000, pp. 358-360