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Results:
1-7
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Results: 7
Authors:
van den Bos, A
Citation: A. Van Den Bos, Aberration and the Strehl ratio, J OPT SOC A, 17(2), 2000, pp. 356-358
Authors:
Patra, JC
van den Bos, A
Kot, AC
Citation: Jc. Patra et al., An ANN-based smart capacitive pressure sensor in dynamic environment, SENS ACTU-A, 86(1-2), 2000, pp. 26-38
Authors:
Patra, JC
van den Bos, A
Citation: Jc. Patra et A. Van Den Bos, Auto-calibration and -compensation of a capacitive pressure sensor using multilayer perceptrons, ISA TRANS, 39(2), 2000, pp. 175-190
Authors:
Patra, JC
van den Bos, A
Citation: Jc. Patra et A. Van Den Bos, Modeling of an intelligent pressure sensor using functional link artificial neural networks, ISA TRANS, 39(1), 2000, pp. 15-27
Authors:
van den Bos, A
Citation: A. Van Den Bos, Rayleigh wave-front criterion: comment, J OPT SOC A, 16(9), 1999, pp. 2307-2309
Authors:
Van Dyck, D
Bettens, E
Sijbers, J
Op de Beeck, M
van den Bos, A
den Dekker, AJ
Jansen, J
Zandbergen, H
Citation: D. Van Dyck et al., Towards quantitative structure determination through electron holographic methods, MATER CHAR, 42(4-5), 1999, pp. 265-281
Authors:
Bettens, E
Van Dyck, D
den Dekker, AJ
Sijbers, J
van den Bos, A
Citation: E. Bettens et al., Model-based two-object resolution from observations having counting statistics, ULTRAMICROS, 77(1-2), 1999, pp. 37-48
Risultati:
1-7
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