Authors:
Leonhardt, TD
van de Veerdonk, RJM
van der Heijden, PAA
Clinton, TW
Crawford, TM
Citation: Td. Leonhardt et al., Comparison of perpendicular and longitudinal magnetic recording using a contact write/read tester, IEEE MAGNET, 37(4), 2001, pp. 1580-1582
Authors:
van der Heijden, PAA
Swuste, CHW
de Jonge, WJM
Gaines, JM
van Eemeren, JTWM
Schep, KM
Citation: Paa. Van Der Heijden et al., Evidence for roughness driven 90 degrees coupling in Fe3O4/NiO/Fe3O4 trilayers, PHYS REV L, 82(5), 1999, pp. 1020-1023
Authors:
van der Heijden, PAA
Maas, TFMM
Kools, JCS
Roozeboom, F
van der Zaag, PJ
de Jonge, WJM
Citation: Paa. Van Der Heijden et al., Influences on relaxation of exchange biasing in NiO/Ni66Co18Fe16 bilayers, J APPL PHYS, 83(11), 1998, pp. 7207-7209