Ym. Cho et T. Kailath, MODEL IDENTIFICATION IN RAPID THERMAL-PROCESSING SYSTEMS, IEEE transactions on semiconductor manufacturing, 6(3), 1993, pp. 233-245
Of the various techniques for controlling the temperature in rapid the
rmal processing (RTP), model-based control has the greatest potential
for attaining the best performance, when the model is accurate. In thi
s paper, some so-called system identification methods are introduced t
o help obtain more accurate models from measured input-output data. In
the first identification, techniques are presented to estimate the pa
rameters (time constant and gain) of a particular physics-based model.
In the other, we also show how to use the input-output measurements t
o obtain a black-box model (autoregressive exogenous model) of the RTP
system, which turns out to have better predictive capability. For eac
h problem, a brief summary of the theoretical derivation of the identi
fication technique and assumptions on which it is based is given and e
xperimental results based on data collected from an RTP system are des
cribed. The identified model is useful not only for control law design
but also to study certain system characteristics. Studying the so-cal
led DC response in this way led us to reconfigure the chamber geometry
of the existing RTP system to more effectively redistribute the light
energy from the lamps.