This paper considers model uncertainty in the run-to-run control probl
em from a probabilistic viewpoint. The methodology assumes that the mo
del parameters are stochastic and uses experimental input-output data
off-line to characterize the probability distribution of the model par
ameters. This naturally leads to the notions of probability of stabili
ty and probability of performance as a means of evaluating run-to-run
controllers, Analytic formulas for the probability of stability are gi
ven for the particular case of an EWMA controller. When considering a
more general notion of performance, the Monte Carlo method is used to
approximate the probability of performance to a high degree of confide
nce, This probabilistic approach to run-to-run control is then illustr
ated on a virtual plasma etching reactor. Finally, the reliability of
the method is investigated.