Ea. Rietman et M. Beachy, A STUDY ON FAILURE PREDICTION IN A PLASMA REACTOR, IEEE transactions on semiconductor manufacturing, 11(4), 1998, pp. 670-680
We use several approaches to demonstrate that neural networks can dete
ct precursors to failure, That is, they can detect subtle changes in t
he process signals. In some cases these subtle changes are early warni
ngs that a subsystem failure Is imminent. The results on detection of
precursors and faults with various types of time-delay neural networks
are discussed. We also measure the noise inherent in our database and
place bounds on neural network prediction in the presence of noise. W
e observe that the noise level can be as high as 40% for detection of
failures and can be at 30% to still detect precursors to failure. We n
ote that although self-organizing networks for classification of fault
s seems like a good idea, in fact they do not perform well in the pres
ence of noise. Lastly, we show that neural networks can induce, or sel
f-build, Markov models from process data and these models can be used
to predict system state to a significant distance in the future (e,g,,
100 wafers).