Authors:
REJMANKOVA P
BARUCHEL J
MORETTI P
ARBORE M
FEJER M
FOULON G
Citation: P. Rejmankova et al., VISUALIZATION OF INVERTED FERROELECTRIC DOMAINS IN LINBO3 BY X-RAY TOPOGRAPHY, Journal of applied crystallography, 31, 1998, pp. 106-108
Citation: M. Yamada et M. Hida, X-RAY COMPTON-SCATTERING FROM ALUMINUM AND SILICON-CRYSTALS AT LOW SCATTERING ANGLES, Journal of applied crystallography, 30, 1997, pp. 889-892
Citation: H. Kahlert et al., NEUTRON POWDER INVESTIGATIONS OF ZR0.85CA0.15O1.85 SINTER MATERIAL ATTEMPERATURES UP TO 1100K AND WITH A SIMULTANEOUSLY APPLIED ELECTRIC-FIELD, Journal of applied crystallography, 30, 1997, pp. 893-899
Authors:
SIMON JP
ARNAUD S
BLEY F
BERAR JF
CAILLOT B
COMPARAT V
GEISSLER E
DEGEYER A
JEANTEY P
LIVET F
OKUDA H
Citation: Jp. Simon et al., A NEW SMALL-ANGLE X-RAY-SCATTERING INSTRUMENT ON THE FRENCH CRG BEAMLINE AT THE ESRF MULTIWAVELENGTH ANOMALOUS SCATTERING DIFFRACTION BEAMLINE (D2AM)/, Journal of applied crystallography, 30, 1997, pp. 900-904
Citation: U. Niggemeier et al., X-RAY REFLECTOMETER FOR THE DIAGNOSTICS OF THIN-FILMS DURING GROWTH, Journal of applied crystallography, 30, 1997, pp. 905-908
Citation: W. Lasocha et H. Schenk, CRYSTAL-STRUCTURE OF ANILINIUM PENTAMOLYBDATE FROM POWDER DIFFRACTIONDATA - THE SOLUTION OF THE CRYSTAL-STRUCTURE BY DIRECT-METHODS PACKAGE POWSIM, Journal of applied crystallography, 30, 1997, pp. 909-913
Citation: F. Bley et al., AN ANOMALOUS SMALL-ANGLE X-RAY-SCATTERING STUDY ON PHASE-DECOMPOSITION IN A MODEL SUPERALLOY NICRAL, Journal of applied crystallography, 30, 1997, pp. 914-917
Authors:
SHINOHARA AH
OMOTE K
SEKIYA EH
SHINODA K
TORIKAI D
SUZUKI CK
ZAVAGLIA CAC
Citation: Ah. Shinohara et al., SMALL-ANGLE X-RAY-SCATTERING OF HEAT-TREATED FLAME-FUSED SILICA GLASSFROM AMORPHOUS AND CRYSTALLINE POWDERS, Journal of applied crystallography, 30, 1997, pp. 918-920
Citation: O. Dupont et al., ADAPTATION OF THE RIETVELD METHOD FOR THE CHARACTERIZATION OF THE LAMELLAR MICROSTRUCTURE OF POLYMERS, Journal of applied crystallography, 30, 1997, pp. 921-931
Citation: Rm. Richardson et al., STUDY OF OFF-SPECULAR NEUTRON REFLECTIVITY USING A MODEL SYSTEM, Journal of applied crystallography, 30, 1997, pp. 943-947
Authors:
KUTSCH B
LYON O
SCHMITT M
MENNIG M
SCHMIDT H
Citation: B. Kutsch et al., SMALL-ANGLE X-RAY-SCATTERING EXPERIMENTS IN GRAZING-INCIDENCE ON SOL-GEL COATINGS CONTAINING NANO-SCALED COLLOIDS - A NEW TECHNIQUE FOR INVESTIGATING THIN COATINGS AND FILMS, Journal of applied crystallography, 30, 1997, pp. 948-956
Citation: H. Graafsma et al., AN X-RAY CHARGE-DENSITY FEASIBILITY STUDY AT 56 KEV OF MAGNESIUM FORMATE DIHYDRATE USING A CCD AREA DETECTOR, Journal of applied crystallography, 30, 1997, pp. 957-962
Citation: W. Press et al., NON-GAUSSIAN ROUGHNESS OF INTERFACES - CUMULANT EXPANSION IN X-RAY AND NEUTRON REFLECTIVITY, Journal of applied crystallography, 30, 1997, pp. 963-967
Authors:
TREMAYNE M
KARIUKI BM
HARRIS KDM
SHANKLAND K
KNIGHT KS
Citation: M. Tremayne et al., CRYSTAL-STRUCTURE SOLUTION FROM NEUTRON POWDER DIFFRACTION DATA BY A NEW MONTE-CARLO APPROACH INCORPORATING RESTRAINED RELAXATION OF THE MOLECULAR-GEOMETRY, Journal of applied crystallography, 30, 1997, pp. 968-974
Authors:
PEDERSEN JS
VYSCKOCIL P
SCHONFELD B
KOSTORZ G
Citation: Js. Pedersen et al., SMALL-ANGLE NEUTRON-SCATTERING OF PRECIPITATES IN NI-RICH NI-TI ALLOYS - II - METHODS FOR ANALYZING ANISOTROPIC SCATTERING DATA, Journal of applied crystallography, 30, 1997, pp. 975-984
Authors:
GROSSEKUNSTLEVE RW
MCCUSKER LB
BAERLOCHER C
Citation: Rw. Grossekunstleve et al., POWDER DIFFRACTION DATA AND CRYSTAL-CHEMICAL INFORMATION COMBINED IN AN AUTOMATED STRUCTURE DETERMINATION PROCEDURE FOR ZEOLITES, Journal of applied crystallography, 30, 1997, pp. 985-995
Citation: K. Nakashima et H. Sugiura, A NOVEL METHOD OF ANALYZING PEAK BROADENING DUE TO MOSAICITY FOR CUBIC-CRYSTALS ON (001)SUBSTRATE USING DOUBLE-CRYSTAL X-RAY-DIFFRACTION MEASUREMENTS, Journal of applied crystallography, 30, 1997, pp. 1002-1007
Citation: Jw. Otto, ON THE PEAK PROFILES IN ENERGY-DISPERSIVE POWDER X-RAY-DIFFRACTION WITH SYNCHROTRON-RADIATION, Journal of applied crystallography, 30, 1997, pp. 1008-1015
Citation: C. Kumpf et al., GROWTH AND STRUCTURE OF THIN PT2SI AND PTSI LAYERS ON SI(111) AND SI(001) CHARACTERIZED WITH IN-SITU GRAZING-INCIDENCE DIFFRACTION, Journal of applied crystallography, 30, 1997, pp. 1016-1021
Citation: A. Vagin et A. Teplyakov, MOLREP - AN AUTOMATED PROGRAM FOR MOLECULAR REPLACEMENT, Journal of applied crystallography, 30, 1997, pp. 1022-1025
Citation: S. Ciccariello et R. Sobry, DIFFUSE INTERFACES AND SMALL-ANGLE SCATTERING INTENSITY BEHAVIOR, Journal of applied crystallography, 30, 1997, pp. 1026-1035
Citation: I. Steller et al., AN ALGORITHM FOR AUTOMATIC-INDEXING OF OSCILLATION IMAGES USING FOURIER-ANALYSIS, Journal of applied crystallography, 30, 1997, pp. 1036-1040
Citation: G. Goerigk et al., KINETICS OF DECOMPOSITION IN COPPER-COBALT - A TIME-RESOLVED ASAXS STUDY, Journal of applied crystallography, 30, 1997, pp. 1041-1047