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Results: 51-75/213
Authors:
GRIGOROV GI
GRIGOROV KG
VIGNES JL
LANGERON JP
SPORKEN R
Citation: Gi. Grigorov et al., BINARY THIN-FILMS DEPOSITED BY ION-BEAMS - SIMPLE ESTIMATE OF THE NEAR-SURFACE AND BULK COMPOSITION, Le Vide, 52(280), 1996, pp. 244
Authors:
RICARD A
POPESCU A
BALTOG A
LUNGU CP
Citation: A. Ricard et al., INFLUENCE OF THE WALL MATERIAL ON N ATOM DENSITY IN A DOWNSTREAM NITROGEN PLASMA, Le Vide, 52(280), 1996, pp. 248
Authors:
LANGERON JP
Citation: Jp. Langeron, UNTITLED, Le Vide, 52(279), 1996, pp. 1-1
Authors:
SPANJARD D
Citation: D. Spanjard, AES AND XPS PEAKS SHAPE, Le Vide, 52(279), 1996, pp. 13
Authors:
DUBUS A
Citation: A. Dubus, INELASTIC AND ELASTIC COLLISIONS, TRANSPO RT AND SCAPE OF ELECTRONS IN AES AND XPS, Le Vide, 52(279), 1996, pp. 24
Authors:
LORANG G
Citation: G. Lorang, INSTRUMENTAL EFFECTS AND SPECTRA NORMALIZ ATION, Le Vide, 52(279), 1996, pp. 34
Authors:
REPOUX M
Citation: M. Repoux, DATA-PROCESSING, Le Vide, 52(279), 1996, pp. 44
Authors:
OLLIVIER E
Citation: E. Ollivier, XPS PEAK FITTING, Le Vide, 52(279), 1996, pp. 53
Authors:
CAZAUX J
Citation: J. Cazaux, SCANNING AUGER MICROSCOPY - PRINCIPLE AND ARTIFACTS, Le Vide, 52(279), 1996, pp. 65
Authors:
CAZAUX J
Citation: J. Cazaux, INSULATING MATERIALS XPS AND AES ANALYSIS, Le Vide, 52(279), 1996, pp. 73
Authors:
MATHIEU HJ
Citation: Hj. Mathieu, AES AND XPS DEPTH PROFILE ANALYSIS - A CRITICAL-REVIEW, Le Vide, 52(279), 1996, pp. 81
Authors:
SPORKEN R
Citation: R. Sporken, FACTOR-ANALYSIS IN AES - MINUTES OF THE N FWO MEETING, IN ZELLIK, BELGIUM, Le Vide, 52(279), 1996, pp. 92
Authors:
AGLIZ D
ABABOU S
LEPINE B
GUIVARCH A
SEBILLEAU D
QUEMERAIS A
JEZEQUEL G
Citation: D. Agliz et al., ELASTIC AND INELASTIC-SCATTERING OF PHOTO EMITTED ELEMENTS FROM GAAS(100) BY SINGLE-CRYSTAL OR DISORDERED FILMS, Le Vide, 52(279), 1996, pp. 94-95
Authors:
CARDINAUD C
Citation: C. Cardinaud, INFLUENCE OF THE SUBTRACTION METHOD OF TH E XPS ELASTIC BACKGROUND ONTHE SHAPE OF SPECTRA AND INTEGRATED INTENSITY, Le Vide, 52(279), 1996, pp. 96-98
Authors:
LESIAK B
Citation: B. Lesiak, APPLICATION OF THE PATTERN-RECOGNITION METHOD TO ELECTRON SPECTROSCOPIES (AES AND XPS), Le Vide, 52(279), 1996, pp. 99-102
Authors:
MARCHAL F
LOUETTE P
SPORKEN R
VELDEKENS JF
CAUDANO R
Citation: F. Marchal et al., UPDATING OF THE CONTROL-SYSTEM OF A SCANN ING AUGER MICROPROBE PHI-595, Le Vide, 52(279), 1996, pp. 103-104
Authors:
DOUST T
Citation: T. Doust, SA - AN AUGER-SPECTROSCOPY QUANTIFICATION PROGRAM, Le Vide, 52(279), 1996, pp. 105-105
Authors:
JARDIN C
RENOUD R
Citation: C. Jardin et R. Renoud, PROBLEMS POSED BY ANALYSIS OF INSULATORS IN AUGER-ELECTRON SPECTROSCOPY, Le Vide, 52(279), 1996, pp. 106-110
Authors:
ROLLAND A
Citation: A. Rolland, QUANTIFICATION OF AUGER-SPECTROSCOPY IN S EGREGATION STUDIES - PROBLEMS, SOLUTIONS AND LIMITATIONS, Le Vide, 52(279), 1996, pp. 111-113
Authors:
BALLUTAUD D
SEVERAC C
Citation: D. Ballutaud et C. Severac, PROFILES OF CONCENTRATIONS AND CHEMICAL-S TATE OF ELEMENTS IN A MULTILAYERED SI3N4 SIO2/SI FILM/, Le Vide, 52(279), 1996, pp. 114-115
Authors:
GALTAYRIES A
WISNIEWSKI S
GRIMBLOT J
Citation: A. Galtayries et al., SURFACE OXIDATION AND SULFURATION OF MOLY BDENUM FOLLOWED BY XPS AND SURFACE-POTENTIAL MEASUREMENT, Le Vide, 52(279), 1996, pp. 116-117
Authors:
CLAUDEL D
ROUXEL D
PIGEAT P
WEBER B
Citation: D. Claudel et al., EARLY STAGES OF ZIRCONIUM OXIDATION AND E VOLUTION OF ZIRCONIA FILM GROWTH WITH TEMPERATURE ANALYZED BY AUGER SPECTROMETRY, Le Vide, 52(279), 1996, pp. 118-120
Authors:
GRIGOROV K
SPORKEN R
RIGA J
CAUDANO R
BOUCHIER D
GRIGOROV GI
Citation: K. Grigorov et al., AUGER AND XPS ANALYSIS OF THE TIO SI INTE RFACE/, Le Vide, 52(279), 1996, pp. 121-124
Authors:
SILVAIN JF
BIHR JC
Citation: Jf. Silvain et Jc. Bihr, XPS ANALYSIS OF FIBER-MATRIX INTERFACES I N MODEL COMPOSITE-MATERIALS, Le Vide, 52(279), 1996, pp. 125-127
Authors:
FOUSSE D
SCHROEDER D
Citation: D. Fousse et D. Schroeder, MODELING OF EPOXY-PHENOL COATING ADHESION TO WHITE CAST-IRON AND CHROMITE, Le Vide, 52(279), 1996, pp. 128-130