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Results: 1-11 |
Results: 11
IMPROVEMENT OF HOT-CARRIER RELIABILITY WITH DEUTERIUM ANNEALS FOR MANUFACTURING MULTILEVEL METAL DIELECTRIC MOS SYSTEMS/
Authors: KIZILYALLI IC ABELN GC CHEN Z LEE J WEBER G KOTZIAS B CHETLUR S LYDING JW HESS K
Citation: Ic. Kizilyalli et al., IMPROVEMENT OF HOT-CARRIER RELIABILITY WITH DEUTERIUM ANNEALS FOR MANUFACTURING MULTILEVEL METAL DIELECTRIC MOS SYSTEMS/, IEEE electron device letters, 19(11), 1998, pp. 444-446
ULTRAHIGH VACUUM-SCANNING TUNNELING MICROSCOPY NANOFABRICATION AND HYDROGEN DEUTERIUM DESORPTION FROM SILICON SURFACES - IMPLICATIONS FOR COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR TECHNOLOGY/
Authors: LYDING JW HESS K ABELN GC THOMPSON DS MOORE JS HERSAM MC FOLEY ET LEE J CHEN Z HWANG ST CHOI H AVOURIS P KIZILYALLI IC
Citation: Jw. Lyding et al., ULTRAHIGH VACUUM-SCANNING TUNNELING MICROSCOPY NANOFABRICATION AND HYDROGEN DEUTERIUM DESORPTION FROM SILICON SURFACES - IMPLICATIONS FOR COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR TECHNOLOGY/, Applied surface science, 132, 1998, pp. 221-230
NANOPATTERNING ORGANIC MONOLAYERS ON SI(100) BY SELECTIVE CHEMISORPTION OF NORBORNADIENE
Authors: ABELN GC LEE SY LYDING JW THOMPSON DS MOORE JS
Citation: Gc. Abeln et al., NANOPATTERNING ORGANIC MONOLAYERS ON SI(100) BY SELECTIVE CHEMISORPTION OF NORBORNADIENE, Applied physics letters, 70(20), 1997, pp. 2747-2749
NANOSCALE PATTERNING AND SELECTIVE CHEMISTRY OF SILICON SURFACES BY ULTRAHIGH-VACUUM SCANNING-TUNNELING-MICROSCOPY
Authors: LYDING JW SHEN TC ABELN GC WANG C TUCKER JR
Citation: Jw. Lyding et al., NANOSCALE PATTERNING AND SELECTIVE CHEMISTRY OF SILICON SURFACES BY ULTRAHIGH-VACUUM SCANNING-TUNNELING-MICROSCOPY, Nanotechnology, 7(2), 1996, pp. 128-133
BREAKING INDIVIDUAL CHEMICAL-BONDS VIA STM-INDUCED EXCITATIONS
Authors: AVOURIS P WALKUP RE ROSSI AR AKPATI HC NORDLANDER P SHEN TC ABELN GC LYDING JW
Citation: P. Avouris et al., BREAKING INDIVIDUAL CHEMICAL-BONDS VIA STM-INDUCED EXCITATIONS, Surface science, 363(1-3), 1996, pp. 368-377
ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE-BASED NANOLITHOGRAPHY AND SELECTIVE CHEMISTRY ON SILICON SURFACES
Authors: LYDING JW SHEN TC ABELN GC WANG C SCOTT PA TUCKER JR AVOURIS P WALKUP RE
Citation: Jw. Lyding et al., ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE-BASED NANOLITHOGRAPHY AND SELECTIVE CHEMISTRY ON SILICON SURFACES, Israel Journal of Chemistry, 36(1), 1996, pp. 3-10
STM-INDUCED H ATOM DESORPTION FROM SI(100) - ISOTOPE EFFECTS AND SITESELECTIVITY
Authors: AVOURIS P WALKUP RE ROSSI AR SHEN TC ABELN GC TUCKER JR LYDING JW
Citation: P. Avouris et al., STM-INDUCED H ATOM DESORPTION FROM SI(100) - ISOTOPE EFFECTS AND SITESELECTIVITY, Chemical physics letters, 257(1-2), 1996, pp. 148-154
NANOSCALE STM-PATTERNING AND CHEMICAL MODIFICATION OF THE SI(100) SURFACE
Authors: ABELN GC SHEN TC TUCKER JR LYDING JW
Citation: Gc. Abeln et al., NANOSCALE STM-PATTERNING AND CHEMICAL MODIFICATION OF THE SI(100) SURFACE, Microelectronic engineering, 27(1-4), 1995, pp. 23-26
ATOMIC-SCALE DESORPTION THROUGH ELECTRONIC AND VIBRATIONAL-EXCITATIONMECHANISMS
Authors: SHEN TC WANG C ABELN GC TUCKER JR LYDING JW AVOURIS P WALKUP RE
Citation: Tc. Shen et al., ATOMIC-SCALE DESORPTION THROUGH ELECTRONIC AND VIBRATIONAL-EXCITATIONMECHANISMS, Science, 268(5217), 1995, pp. 1590-1592
NANOMETER-SCALE PATTERNING AND OXIDATION OF SILICON SURFACES WITH AN ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE
Authors: LYDING JW ABELN GC SHEN TC WANG C TUCKER JR
Citation: Jw. Lyding et al., NANOMETER-SCALE PATTERNING AND OXIDATION OF SILICON SURFACES WITH AN ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3735-3740
NANOSCALE PATTERNING AND OXIDATION OF H-PASSIVATED SI(100)-2X1 SURFACES WITH AN ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE
Authors: LYDING JW SHEN TC HUBACEK JS TUCKER JR ABELN GC
Citation: Jw. Lyding et al., NANOSCALE PATTERNING AND OXIDATION OF H-PASSIVATED SI(100)-2X1 SURFACES WITH AN ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE, Applied physics letters, 64(15), 1994, pp. 2010-2012
Risultati: 1-11 |