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Results: 1-7 |
Results: 7

Authors: MIZUNO M ABIKO H FURUTA K SAKAI I YAMASHINA M
Citation: M. Mizuno et al., DEVICE-DEVIATION TOLERANT ELASTIC-VT CMOS CIRCUITS WITH FINE-GRAIN POWER-CONTROL CAPABILITY, IEICE transactions on electronics, E81C(9), 1998, pp. 1463-1472

Authors: INOUE K MIKAGI K ABIKO H CHIKAKI S KIKKAWA T
Citation: K. Inoue et al., A NEW COBALT SALICIDE TECHNOLOGY FOR 0.15-MU-M CMOS DEVICES, I.E.E.E. transactions on electron devices, 45(11), 1998, pp. 2312-2318

Authors: ABIKO H ONO A UENO R MASUOKA S SHISHIGUCHI S NAKAJIMA K SAKAI I
Citation: H. Abiko et al., 0.15-MU-M N-N GATE CMOS TECHNOLOGY WITH CHANNEL SELECTIVE EPITAXY ANDTRANSIENT ENHANCED DIFFUSION SUPPRESSION, Electronics & communications in Japan. Part 2, Electronics, 79(11), 1996, pp. 28-35

Authors: MIZUNO M YAMASHINA M FURUTA K IGURA H ABIKO H OKABE K ONO A YAMADA H
Citation: M. Mizuno et al., A GHZ MOS ADAPTIVE PIPELINE TECHNIQUE USING MOS CURRENT-MODE LOGIC, IEEE journal of solid-state circuits, 31(6), 1996, pp. 784-791

Authors: SUZUKI K YAMASHINA M NAKAYAMA T IZUMIKAWA M NOMURA M IGURA H HEIUCHI H GOTO J INOUE T KOSEKI Y ABIKO H OKABE K ONO A YANO Y YAMADA H
Citation: K. Suzuki et al., A 500-MHZ, 32-BIT, 0.4-MU-M CMOS RISC PROCESSOR, IEEE journal of solid-state circuits, 29(12), 1994, pp. 1464-1473

Authors: GEORGIOU GE ABIKO H BAIOCCHI FA HA NT NAKAHARA S
Citation: Ge. Georgiou et al., THERMAL-STABILITY LIMITS OF THIN TISI2 - EFFECT ON SUBMICRON LINE RESISTANCE AND SHALLOW JUNCTION LEAKAGE, Journal of the Electrochemical Society, 141(5), 1994, pp. 1351-1356

Authors: ABIKO H
Citation: H. Abiko, PREVENTIVE MEASURES AGAINST CRACK OF ROTA RY DIFFUSER TYPE IDF IMPELLER OF OXYGEN CONVERTER GAS RECOVERY-SYSTEM, Tetsu to hagane, 79(10), 1993, pp. 200000145-200000147
Risultati: 1-7 |