AAAAAA

   
Results: 1-25 | 26-38
Results: 1-25/38
A NEW TECHNIQUE FOR CHARACTERIZATION OF PORE STRUCTURES IN MATERIALS - APPLICATION TO THE STUDY OF HYDROXYAPATITE THIN-FILMS
Authors: LOPATIN CM ALFORD TL PIZZICONI VB LAURSEN T
Citation: Cm. Lopatin et al., A NEW TECHNIQUE FOR CHARACTERIZATION OF PORE STRUCTURES IN MATERIALS - APPLICATION TO THE STUDY OF HYDROXYAPATITE THIN-FILMS, Materials letters, 37(4-5), 1998, pp. 211-214
CORROSION OF TITANIUM-NITRIDE ENCAPSULATED SILVER FILMS EXPOSED TO A H2S AMBIENT
Authors: ADAMS D JULIES BA MAYER JW ALFORD TL
Citation: D. Adams et al., CORROSION OF TITANIUM-NITRIDE ENCAPSULATED SILVER FILMS EXPOSED TO A H2S AMBIENT, Thin solid films, 332(1-2), 1998, pp. 235-239
HYDROXYAPATITE POWDERS AND THIN-FILMS PREPARED BY A SOL-GEL TECHNIQUE
Authors: LOPATIN CM PIZZICONI V ALFORD TL LAURSEN T
Citation: Cm. Lopatin et al., HYDROXYAPATITE POWDERS AND THIN-FILMS PREPARED BY A SOL-GEL TECHNIQUE, Thin solid films, 326(1-2), 1998, pp. 227-232
WET OXIDATION OF AMORPHOUS SI0.67GE0.25C0.08 GROWN ON (100)SI SUBSTRATES
Authors: BAIR AE ATZMON Z ALFORD TL
Citation: Ae. Bair et al., WET OXIDATION OF AMORPHOUS SI0.67GE0.25C0.08 GROWN ON (100)SI SUBSTRATES, Journal of applied physics, 83(5), 1998, pp. 2835-2841
TEXTURE AND MICROSTRUCTURAL EVOLUTION OF THIN SILVER FILMS IN AG TI BILAYERS/
Authors: ZENG YX ALFORD TL ZOU YL AMALI A ULLRICH BM DENG F LAU SS
Citation: Yx. Zeng et al., TEXTURE AND MICROSTRUCTURAL EVOLUTION OF THIN SILVER FILMS IN AG TI BILAYERS/, Journal of applied physics, 83(2), 1998, pp. 779-785
A COMPARATIVE-STUDY OF REFRACTORY-METAL NITRIDATION IN AN NH3 AMBIENT
Authors: ZOU YL ALFORD TL ZENG YX LAURSEN T ULRICH BM
Citation: Yl. Zou et al., A COMPARATIVE-STUDY OF REFRACTORY-METAL NITRIDATION IN AN NH3 AMBIENT, Thin solid films, 308, 1997, pp. 410-414
TITANIUM-NITRIDE SELF-ENCAPSULATION OF CU AND AG FILMS ON SILICON DIOXIDE
Authors: ADAMS D LAURSEN T ALFORD TL MAYER JW
Citation: D. Adams et al., TITANIUM-NITRIDE SELF-ENCAPSULATION OF CU AND AG FILMS ON SILICON DIOXIDE, Thin solid films, 308, 1997, pp. 448-454
TEXTURE IN EVAPORATED AG THIN-FILMS AND ITS EVOLUTION DURING ENCAPSULATION PROCESS
Authors: ZENG YX ZOU YL ALFORD TL
Citation: Yx. Zeng et al., TEXTURE IN EVAPORATED AG THIN-FILMS AND ITS EVOLUTION DURING ENCAPSULATION PROCESS, Thin solid films, 307(1-2), 1997, pp. 89-95
FORMATION OF TITANIUM NITRIDE BY ANNEALING AG TI STRUCTURES IN AMMONIA AMBIENT/
Authors: ZOU YL ALFORD TL ZENG YX DENG F LAU SS LAURSEN T AMALI AI ULLRICH BM
Citation: Yl. Zou et al., FORMATION OF TITANIUM NITRIDE BY ANNEALING AG TI STRUCTURES IN AMMONIA AMBIENT/, Journal of applied physics, 82(7), 1997, pp. 3321-3327
TEXTURE AND STRESS OF AG FILMS IN AG TI, AG/CR BILAYERS, AND SELF-ENCAPSULATED STRUCTURES/
Authors: ZENG YX ZOU YL ALFORD TL DENG F LAU SS LAURSEN T ULLRICH BM
Citation: Yx. Zeng et al., TEXTURE AND STRESS OF AG FILMS IN AG TI, AG/CR BILAYERS, AND SELF-ENCAPSULATED STRUCTURES/, Journal of applied physics, 81(12), 1997, pp. 7773-7777
CU ENHANCED OXIDATION OF SIGE AND SIGEC
Authors: JAQUEZ EJ BAIR AE ALFORD TL
Citation: Ej. Jaquez et al., CU ENHANCED OXIDATION OF SIGE AND SIGEC, Applied physics letters, 70(7), 1997, pp. 874-876
INFLUENCE OF INTERFACIAL COPPER DURING THE DEALLOYING AND NITRIDATIONOF CU-TI FILMS
Authors: ALFORD TL ADAMS D THEODORE ND LAURSEN T KIM MJ
Citation: Tl. Alford et al., INFLUENCE OF INTERFACIAL COPPER DURING THE DEALLOYING AND NITRIDATIONOF CU-TI FILMS, Materials chemistry and physics, 46(2-3), 1996, pp. 248-251
COMPARISON BETWEEN PREDICTED STRAIN VALUES USING ELASTIC THEORY AND EXPERIMENTAL STRAIN VALUES FOR SIGEC ALLOY-FILMS GROWN ON SI(001)
Authors: SEGO S CULBERTSON RJ BAIR AE ALFORD TL
Citation: S. Sego et al., COMPARISON BETWEEN PREDICTED STRAIN VALUES USING ELASTIC THEORY AND EXPERIMENTAL STRAIN VALUES FOR SIGEC ALLOY-FILMS GROWN ON SI(001), Materials chemistry and physics, 46(2-3), 1996, pp. 277-282
AN X-RAY-DIFFRACTION STUDY OF THE STRAIN AND STRUCTURE OF SIGEC (100)SI ALLOYS/
Authors: BAIR AE ALFORD TL SEGO S ATZMON Z CULBERTSON RJ
Citation: Ae. Bair et al., AN X-RAY-DIFFRACTION STUDY OF THE STRAIN AND STRUCTURE OF SIGEC (100)SI ALLOYS/, Materials chemistry and physics, 46(2-3), 1996, pp. 283-287
FORMATION OF PASSIVATION AND ADHESION LAYERS FOR CU VIA NITRIDATION OF CU-TI IN AN AMMONIA AMBIENT
Authors: ADAMS D ALFORD TL RAFALSKI SA RACK MJ RUSSELL SW KIM MJ MAYER JW
Citation: D. Adams et al., FORMATION OF PASSIVATION AND ADHESION LAYERS FOR CU VIA NITRIDATION OF CU-TI IN AN AMMONIA AMBIENT, Materials chemistry and physics, 43(2), 1996, pp. 145-152
GUIDELINES TO THE APPLICATION OF NUCLEAR-RESONANCE TO QUANTITATIVE THIN-FILM ANALYSIS
Authors: RUSSELL SW LEVINE TE BAIR AE ALFORD TL
Citation: Sw. Russell et al., GUIDELINES TO THE APPLICATION OF NUCLEAR-RESONANCE TO QUANTITATIVE THIN-FILM ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 201-205
COMPARISON OF ELASTIC RESONANCE AND ELASTIC RECOIL DETECTION IN THE QUANTIFICATION OF CARBON IN SIGEC
Authors: BAIR AE ATZMON Z RUSSELL SW BARBOUR JC ALFORD TL MAYER JW
Citation: Ae. Bair et al., COMPARISON OF ELASTIC RESONANCE AND ELASTIC RECOIL DETECTION IN THE QUANTIFICATION OF CARBON IN SIGEC, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 274-277
CARBON DEPENDENCE OF RAMAN MODE FREQUENCIES IN SI1-X-YGEXCY ALLOYS
Authors: MELENDEZLIRA M MENENDEZ J WINDL W SANKEY OF SPENCER GS SEGO S CULBERTSON RB BAIR AE ALFORD TL
Citation: M. Melendezlira et al., CARBON DEPENDENCE OF RAMAN MODE FREQUENCIES IN SI1-X-YGEXCY ALLOYS, Physical review. B, Condensed matter, 54(18), 1996, pp. 12866-12872
ENCAPSULATION OF SILVER BY NITRIDATION OF AG-TI ALLOY BILAYER STRUCTURES
Authors: LAURSEN T ADAMS D ALFORD TL TU KN DENG F MORTON R LAU SS
Citation: T. Laursen et al., ENCAPSULATION OF SILVER BY NITRIDATION OF AG-TI ALLOY BILAYER STRUCTURES, Thin solid films, 291, 1996, pp. 411-416
THE FABRICATION OF NICKEL AND CHROMIUM SILICIDE USING AN XECL EXCIMER-LASER
Authors: BARBERO CJ DENG C SIGMON TW RUSSELL SW ALFORD TL
Citation: Cj. Barbero et al., THE FABRICATION OF NICKEL AND CHROMIUM SILICIDE USING AN XECL EXCIMER-LASER, Journal of crystal growth, 165(1-2), 1996, pp. 57-60
THE APPLICATION OF ION-BEAM ANALYSIS TO CALCIUM PHOSPHATE-BASED BIOMATERIALS
Authors: RUSSELL SW ALFORD TL LUPTAK KA PIZZICONI VB MAYER JW
Citation: Sw. Russell et al., THE APPLICATION OF ION-BEAM ANALYSIS TO CALCIUM PHOSPHATE-BASED BIOMATERIALS, Journal of biomedical materials research, 30(2), 1996, pp. 165-174
AU-MEDIATED LOW-TEMPERATURE SOLID-PHASE EPITAXIAL-GROWTH OF A SIXGE1-X ALLOY ON SI(001)
Authors: RAMANATH G XIAO HZ LAI SL ALLEN LH ALFORD TL
Citation: G. Ramanath et al., AU-MEDIATED LOW-TEMPERATURE SOLID-PHASE EPITAXIAL-GROWTH OF A SIXGE1-X ALLOY ON SI(001), Journal of applied physics, 79(6), 1996, pp. 3094-3102
INFLUENCE OF INTERFACIAL COPPER ON THE ROOM-TEMPERATURE OXIDATION OF SILICON
Authors: ALFORD TL JAQUEZ EJ THEODORE ND RUSSELL SW DIALE M ADAMS D ANDERS S
Citation: Tl. Alford et al., INFLUENCE OF INTERFACIAL COPPER ON THE ROOM-TEMPERATURE OXIDATION OF SILICON, Journal of applied physics, 79(4), 1996, pp. 2074-2078
TITANIUM NITRIDATION ON COPPER SURFACES
Authors: RUSSELL SW RACK MJ ADAMS D ALFORD TL LEVINE TE NASTASI M
Citation: Sw. Russell et al., TITANIUM NITRIDATION ON COPPER SURFACES, Journal of the Electrochemical Society, 143(7), 1996, pp. 2349-2353
ENCAPSULATION OF AG FILMS ON SIO2 BY TI REACTIONS USING AG-TI ALLOY BILAYER STRUCTURES AND AN NH3 AMBIENT/
Authors: ALFORD TL ADAMS D LAURSEN T ULLRICH BM
Citation: Tl. Alford et al., ENCAPSULATION OF AG FILMS ON SIO2 BY TI REACTIONS USING AG-TI ALLOY BILAYER STRUCTURES AND AN NH3 AMBIENT/, Applied physics letters, 68(23), 1996, pp. 3251-3253
Risultati: 1-25 | 26-38