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Results:
1-7
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Results: 7
Authors:
ALVISI M
DENUNZIO G
FERRARA MC
PERRONE MR
RIZZO A
SCAGLIONE S
VASANELLI L
Citation: M. Alvisi et al., EFFECTS OF SUBSTRATE-TEMPERATURE ON THE LASER DAMAGE THRESHOLD OF SPUTTERED SIO2-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(6), 1998, pp. 3408-3413
Authors:
CAPONE S
LEO G
RELLA R
SICILIANO P
VASANELLI L
ALVISI M
MIRENGHI L
RIZZO A
Citation: S. Capone et al., PHYSICAL CHARACTERIZATION OF HAFNIUM OXIDE THIN-FILMS AND THEIR APPLICATION AS GAS-SENSING DEVICES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(6), 1998, pp. 3564-3568
Authors:
RIZZO A
ALVISI M
SARTO F
SCAGLIONE S
VASANELLI L
Citation: A. Rizzo et al., THE INFLUENCE OF ION MASS AND ENERGY ON THE COMPOSITION OF IBAD OXIDE-FILMS, Surface & coatings technology, 109(1-3), 1998, pp. 297-302
Authors:
ALVISI M
LEO G
RIZZO A
TAPFER L
VASANELLI L
Citation: M. Alvisi et al., SURFACE AND INTERFACE MORPHOLOGY OF THIN OXIDE-FILMS INVESTIGATED BY X-RAY REFLECTIVITY AND ATOMIC-FORCE MICROSCOPY, Surface & coatings technology, 101(1-3), 1998, pp. 76-79
Authors:
ALVISI M
RIZZO A
TAPFER L
VASANELLI L
Citation: M. Alvisi et al., X-RAY REFLECTIVITY ANALYSIS OF THIN TIN AND TIOXNY FILMS DEPOSITED BYDUAL-ION-BEAM SPUTTERING ON (100)SI SUBSTRATES, Thin solid films, 298(1-2), 1997, pp. 130-134
Authors:
BONETTI E
PASQUINI L
SAMPAOLESI E
ALVISI M
Citation: E. Bonetti et al., ANELASTIC RELAXATIONS IN ALUMINUM WITH ULTRAFINE GRAIN-STRUCTURE, Journal de physique. IV, 6(C8), 1996, pp. 345-348
Authors:
RE M
ALVISI M
BONETTI E
TAPFER L
Citation: M. Re et al., NANOCRYSTALLINE AL INVESTIGATED BY TRANSMISSION ELECTRON-MICROSCOPE, Microscopy microanalysis microstructures, 6(5-6), 1995, pp. 673-683
Risultati:
1-7
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