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Authors: BURKHART JH DENISON D BARBOUR JC APBLETT CA
Citation: Jh. Burkhart et al., COMPOSITION ANALYSIS OF ECR-GROWN SIO2 AND SIOXFY FILMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 698-703

Authors: PARMETER JE PETERSEN GA SMITH PM APBLETT CA REID JS NORMAN JAT HOCHBERG AK ROBERTS DA OMSTEAD TR
Citation: Je. Parmeter et al., CHARACTERIZATION OF THIN COPPER-FILMS GROWN VIA CHEMICAL-VAPOR-DEPOSITION USING LIQUID COINJECTION OF TRIMETHYLVINYLSILANE AND (HEXAFLUOROACETYLACETONATE) CU (TRIMETHYLVINYLSILANE), Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(1), 1995, pp. 130-136

Authors: NORMAN JAT ROBERTS DA HOCHBERG AK SMITH P PETERSEN GA PARMETER JE APBLETT CA OMSTEAD TR
Citation: Jat. Norman et al., CHEMICAL ADDITIVES FOR IMPROVED COPPER CHEMICAL-VAPOR-DEPOSITION PROCESSING, Thin solid films, 262(1-2), 1995, pp. 46-51

Authors: PETERSEN GA PARMETER JE APBLETT CA GONZALES MF SMITH PM OMSTEAD TR NORMAN JAT
Citation: Ga. Petersen et al., ENHANCED CHEMICAL-VAPOR-DEPOSITION OF COPPER FROM (HFAC)CU(TMVS) USING LIQUID COINJECTION OF TMVS, Journal of the Electrochemical Society, 142(3), 1995, pp. 939-944
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