Authors: HSU JT LI X AUM P CHAN D VISWANATHAN CR

Citation: Jt. Hsu et al., HOT-CARRIER DEGRADATION OF CMOS INVERTERS AND RING OSCILLATORS AT 77K, Journal de physique. IV, 4(C6), 1994, pp. 37-41

Authors: LI XY DIVAKARUNI R HSU JT PRABHAKAR V AUM P CHAN D VISWANATHAN CR

Citation: Xy. Li et al., EFFECT OF PLASMA POLY-ETCH ON EFFECTIVE CHANNEL-LENGTH AND HOT-CARRIER RELIABILITY IN SUBMICRON TRANSISTORS, IEEE electron device letters, 15(4), 1994, pp. 140-141

Authors: GU T OKANDAN M AWADELKARIM OO FONASH SJ REMBETSKI JF AUM P CHAN YD

Citation: T. Gu et al., IMPACT OF POLYSILICON DRY-ETCHING ON 0.5-MU-M NMOS TRANSISTOR PERFORMANCE - THE PRESENCE OF BOTH PLASMA BOMBARDMENT DAMAGE AND PLASMA CHARGING DAMAGE, IEEE electron device letters, 15(2), 1994, pp. 48-50

Authors: LI X HSU JT AUM P BISSEUR V CHAN D VISWANATHAN CR

Citation: X. Li et al., REAPPEARANCE OF PLASMA-INDUCED OXIDE CHARGE UNDER FOWLER-NORDHEIM STRESS, Electronics Letters, 30(4), 1994, pp. 367-368