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Citation: Av. Ermakov et Vk. Adamchuk, Atomic force tunneling microscope and its application to the study of dielectric breakdown of a diamond film on silicon, TECH PHYS L, 25(3), 1999, pp. 200-202
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Vyatkin, AG
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Citation: Am. Shikin et al., Electronic structure of surface compounds formed under thermal annealing of the La graphite interface, SURF SCI, 429(1-3), 1999, pp. 287-297
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Shikin, AM
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