Authors: Uglov, VV Anishchik, VM Kuleshov, AK Fedotova, JA Kvasov, NT Danilyuk, AL Guenzel, R Reuther, H Richter, E

Citation: Vv. Uglov et al., Plasma immersion N and N+C implantation into high-speed tool steel: surface morphology, phase composition and mechanical properties, SURF COAT, 142, 2001, pp. 406-411

Authors: Alexeev, AM Anishchik, VM Akulov, GY Bykov, VA Grushevskii, VV Ilyich, GK Krylova, GV Kukharenko, LV

Citation: Am. Alexeev et al., Morphology of the dithionylpyrrole Langmuir-Blodgett films and their AFM modification, PHYS LOW-D, 3-4, 2001, pp. 1-8

Authors: Uglov, VV Anishchik, VM Astashynski, VV Astashynski, VM Ananin, SI Askerko, VV Kostyukevich, EA Kuz'mitski, AM Kvasov, NT Danilyuk, AL

Citation: Vv. Uglov et al., Formation of submicron cylindrical structures at silicon surface exposed to a compression plasma flow, JETP LETTER, 74(4), 2001, pp. 213-215

Authors: Yakutovich, NG Dorozhkin, NN Anishchik, VM Novysh, BV

Citation: Ng. Yakutovich et al., Self-consistent band structure calculations for the compounds TiN, Ti0.75Zr0.25N, Ti0.25Zr0.75N, and ZrN by the linear method of augmented slater orbitals, PHYS SOL ST, 42(11), 2000, pp. 1995-1999

Authors: Anishchik, VM Zhukova, SI Repchik, YV

Citation: Vm. Anishchik et al., Effect of radiation-induced defects on electrical properties of Bi films, INORG MATER, 35(7), 1999, pp. 695-697