Authors:
Jakob, M
Appenzeller, J
Knoch, J
Stahl, H
Lengeler, B
Citation: M. Jakob et al., Experimental determination of the Andreev reflection probability using ballistic point contact spectroscopy, MAT SCI E C, 15(1-2), 2001, pp. 63-65
Authors:
Knoch, J
Appenzeller, J
Lengeler, B
Martel, R
Solomon, P
Avouris, P
Dieker, C
Lu, Y
Wang, KL
Scholvin, J
del Alamo, JA
Citation: J. Knoch et al., Technology for the fabrication of ultrashort channel metal-oxide-semiconductor field-effect transistors, J VAC SCI A, 19(4), 2001, pp. 1737-1741
Authors:
Appenzeller, J
Martel, R
Avouris, P
Stahl, H
Hunger, UT
Lengeler, B
Citation: J. Appenzeller et al., Phase-coherent transport in ropes of single-wall carbon nanotubes - art. no. 121404, PHYS REV B, 6412(12), 2001, pp. 1404
Authors:
Appenzeller, J
Martel, R
Avouris, P
Stahl, H
Lengeler, B
Citation: J. Appenzeller et al., Optimized contact configuration for the study of transport phenomena in ropes of single-wall carbon nanotubes, APPL PHYS L, 78(21), 2001, pp. 3313-3315
Authors:
Uhlisch, D
Lachenmann, SG
Schapers, T
Braginski, AI
Luth, H
Appenzeller, J
Golubov, AA
Ustinov, AV
Citation: D. Uhlisch et al., Splitting of the subgap resistance peak in superconductor/two-dimensional electron gas contacts at high magnetic fields, PHYS REV B, 61(18), 2000, pp. 12463-12466
Authors:
Appenzeller, J
Jakob, M
Stahl, H
Knoch, J
Lengeler, B
Citation: J. Appenzeller et al., Spectroscopic measurements on the Andreev reflection probability as a function of temperature, APPL PHYS L, 77(4), 2000, pp. 549-551
Authors:
Appenzeller, J
Martel, R
Solomon, P
Chan, K
Avouris, P
Knoch, J
Benedict, J
Tanner, M
Thomas, S
Wang, KL
del Alamo, JA
Citation: J. Appenzeller et al., Scheme for the fabrication of ultrashort channel metal-oxide-semiconductorfield-effect transistors, APPL PHYS L, 77(2), 2000, pp. 298-300
Authors:
Jakob, M
Stahl, H
Knoch, J
Appenzeller, J
Lengeler, B
Hardtdegen, H
Luth, H
Citation: M. Jakob et al., Direct determination of the Andreev reflection probability by means of point contact spectroscopy, APPL PHYS L, 76(9), 2000, pp. 1152-1154
Authors:
Jakob, M
Stahl, H
Knoch, J
Appenzeller, J
Lengeler, B
Hardtdegen, H
Luth, H
Citation: M. Jakob et al., Direct determination of the Andreev reflection probability by means of point contact spectroscopy (vol 76, pg 1152 2000), APPL PHYS L, 76(19), 2000, pp. 2800-2800