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Authors:
Armand, F
Albouy, PA
Da Cruz, F
Normand, M
Huc, V
Goron, E
Citation: F. Armand et al., Interconnection of porphyrins in Langmuir-Blodgett and self-assembled monolayers by means of silver acetylide bridges, LANGMUIR, 17(11), 2001, pp. 3431-3437
Citation: H. Pouliquen et F. Armand, Determination of oxolinic acid in faeces and urine of turbot (Scophthalmusmaximus) by high-performance liquid chromatography using fluorescence detection, J CHROMAT B, 749(1), 2000, pp. 127-133
Authors:
Henry, C
Armand, F
Araspin, O
Bourgoin, JP
Wegner, G
Citation: C. Henry et al., Structural study of a n-alkylthiophene polymer grown in an oriented ultrathin matrix of alkylcellulose, CHEM MATER, 11(4), 1999, pp. 1024-1029
Authors:
Armand, F
Perez, H
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Araspin, O
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Claessens, CG
Maya, EM
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Citation: F. Armand et al., Tetraamidometallo-phthalocyanines Langmuir-Blodgett films: Morphology versus central metal effects on NO2 detection, SYNTH METAL, 102(1-3), 1999, pp. 1476-1477
Authors:
Nicolau, M
Henry, C
Martinez-Diaz, MV
Torres, T
Armand, F
Palacin, S
Ruaudel-Teixier, A
Wegner, G
Citation: M. Nicolau et al., Synthesis and Langmuir-Blodgett studies of silicon-phthalocyanine oligomers: Potential templates for organizing electroactive monomers, SYNTH METAL, 102(1-3), 1999, pp. 1521-1522
Authors:
Da Cruz, F
Driaf, K
Berthier, C
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Citation: F. Da Cruz et al., Study of a self-assembled porphyrin monomolecular layer obtained by metal complexation, THIN SOL FI, 349(1-2), 1999, pp. 155-161
Citation: Jp. Pradeau et al., Electrical measurement on a phthalocyanine Langmuir-Blodgett film: I. Comprehensive studies on the origins of scattering and drift of resistance values, J PHYS D, 32(9), 1999, pp. 961-967
Citation: Jp. Pradeau et al., Electrical measurement on a phthalocyanine Langmuir-Blodgett film: II. Theeffect of the substrate surface treatment on the electrical characteristics, J PHYS D, 32(9), 1999, pp. 968-974
Authors:
Bonello, B
Armand, F
Pradeau, JP
Perez, H
Perrin, B
Louis, G
Citation: B. Bonello et al., Evidence for the alteration of an organic/metal interface resulting from the formation of a broad interfacial layer, J APPL PHYS, 86(9), 1999, pp. 4959-4963