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Results:
1-4
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Results: 4
Characteristic-impedance measurement error on lossy substrates
Authors:
Williams, DF Arz, U Grabinski, H
Citation:
Df. Williams et al., Characteristic-impedance measurement error on lossy substrates, IEEE MICR W, 11(7), 2001, pp. 299-301
A four-port microwave measurement system to speed on-wafer calibration andtest
Authors:
Walker, DK Williams, DF Padilla, A Arz, U Grabinski, H
Citation:
Dk. Walker et al., A four-port microwave measurement system to speed on-wafer calibration andtest, MICROWAVE J, 44(3), 2001, pp. 148
Broadband modeling and measurement of the signal behavior in S/390 MCM packages
Authors:
Ktata, FM Arz, U Grabinski, H
Citation:
Fm. Ktata et al., Broadband modeling and measurement of the signal behavior in S/390 MCM packages, IEEE T AD P, 23(3), 2000, pp. 375-381
Asymmetric coupled CMOS lines - An experimental study
Authors:
Arz, U Williams, DF Walker, DK Grabinski, H
Citation:
U. Arz et al., Asymmetric coupled CMOS lines - An experimental study, IEEE MICR T, 48(12), 2000, pp. 2409-2414
Risultati:
1-4
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