Citation: X. Baie et Jp. Colinge, 2-DIMENSIONAL CONFINEMENT EFFECTS IN GATE-ALL-AROUND (GAA) MOSFETS, Solid-state electronics, 42(4), 1998, pp. 499-504
Citation: Jp. Colinge et al., EVIDENCE OF 2-DIMENSIONAL CARRIER CONFINEMENT IN THIN N-CHANNEL SOI GATE-ALL-AROUND (GAA) DEVICES, IEEE electron device letters, 15(6), 1994, pp. 193-195