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Results: 1-18 |
Results: 18

Authors: BANGE K
Citation: K. Bange, PROBLEM-ORIENTED ANALYSIS OF OXIDE LAYERS ON GLASS, Glass science and technology, 70(8), 1997, pp. 238-245

Authors: ANDERSON O BANGE K
Citation: O. Anderson et K. Bange, CHARACTERIZATION OF GLASS SURFACES BY X-RAY REFLECTIVITY, Glass science and technology, 70(10), 1997, pp. 316-321

Authors: RUPERTUS V BERRESHEIM K OTTERMANN C THIEL S KOPNARSKI M BANGE K
Citation: V. Rupertus et al., INTERFACE CHARACTERIZATION OF PICVD-COATED POLYMER SUBSTRATES, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 85-88

Authors: ANDERSON O OTTERMANN CR KUSCHNEREIT R HESS P BANGE K
Citation: O. Anderson et al., DENSITY AND YOUNGS MODULUS OF THIN TIO2 FILMS, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 315-318

Authors: ANDERSON O DALDEROP GHO BANGE K
Citation: O. Anderson et al., X-RAY REFLECTIVITY INVESTIGATIONS OF GLASS SURFACES PRODUCED BY FLOATAND DRAW TECHNIQUES, Mikrochimica acta, 125(1-4), 1997, pp. 63-67

Authors: LAUBE M RAUCH F OTTERMANN C ANDERSON O BANGE K
Citation: M. Laube et al., DENSITY OF THIN TIO2 FILMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 113(1-4), 1996, pp. 288-292

Authors: OTTERMANN CR BANGE K
Citation: Cr. Ottermann et K. Bange, CORRELATION BETWEEN THE DENSITY OF TIO2 FILMS AND THEIR PROPERTIES, Thin solid films, 286(1-2), 1996, pp. 32-34

Authors: ANDERSON C ARNOLD GW BANGE K BAUCKE F COLOMBO P DELLAMEA G DRAN JC EMILIANI G BIANCHINI KG KAWAHARA H LEHUEDE P MADDALENA A MANOCHA AS MATZKE HJ MATZUMOTO H MAZZOLDI P NOSHIRO M POLATO P PRINCIPI G RIGATO V
Citation: C. Anderson et al., CHARACTERIZATION OF TIN OXIDE-FILMS BY COMPLEMENTARY TECHNIQUES - REPORT OF ICGITC 19 PHYSICAL METHODS FOR STUDYING GLASS SURFACES, Glass technology, 37(6), 1996, pp. 204-210

Authors: BANGE K
Citation: K. Bange, CHARACTERIZATION OF OXIDE COATINGS ON GLASS, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 240-245

Authors: SCHMITT W DROTBOHM P ROTHE J HORMES J OTTERMANN CR BANGE K
Citation: W. Schmitt et al., THICKNESS DETERMINATION OF THIN SOLID FILMS BY ANGLE-RESOLVED X-RAY-FLUORESCENCE SPECTROMETRY USING MONOCHROMATIZED SYNCHROTRON-RADIATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 97(1-4), 1995, pp. 407-411

Authors: LAUBE M WAGNER W RAUCH F OTTERMANN C BANGE K NIEDERWALD H
Citation: M. Laube et al., COMPOSITION OF TITANIA COATINGS DEPOSITED BY DIFFERENT TECHNIQUES, Glass science and technology, 67(4), 1994, pp. 87-92

Authors: WAGNER W RAUCH F BANGE K
Citation: W. Wagner et al., STOICHIOMETRY OF NIOXHY FILMS DETERMINED BY ION-BEAM ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 89(1-4), 1994, pp. 104-108

Authors: WAGNER W RAUCH F JESCHKOWSKI U BANGE K
Citation: W. Wagner et al., ION-BEAM ANALYSIS INVESTIGATIONS ON MULTILAYER DEVICES FOR VISIBLE OPTICS, Physica status solidi. a, Applied research, 145(2), 1994, pp. 619-623

Authors: WU ZL BANGE K
Citation: Zl. Wu et K. Bange, COMPARATIVE PHOTOTHERMAL STUDY OF REACTIVE LOW-VOLTAGE ION-PLATED ANDELECTRON-BEAM-EVAPORATED TIO2 THIN-FILMS, Applied optics, 33(34), 1994, pp. 7901-7907

Authors: BECKER O BANGE K
Citation: O. Becker et K. Bange, ULTRAMICROTOMY - AN ALTERNATIVE CROSS-SECTION PREPARATION FOR OXIDIC THIN-FILMS ON GLASS, Ultramicroscopy, 52(1), 1993, pp. 73-84

Authors: WAGNER W RAUCH F FEILE R OTTERMANN C BANGE K
Citation: W. Wagner et al., COMPACTION OF TUNGSTEN-OXIDE FILMS BY ION-BEAM IRRADIATION, Thin solid films, 235(1-2), 1993, pp. 228-233

Authors: HUPPAUFF M BANGE K LENGELER B
Citation: M. Huppauff et al., DENSITY, THICKNESS AND INTERFACE ROUGHNESS OF SIO2 TIO2 AND TA2O5 FILMS ON BK-7 GLASSES ANALYZED BY X-RAY REFLECTION, Thin solid films, 230(2), 1993, pp. 191-198

Authors: GUTMANNSBAUER W HAEFKE H RUETSCHI M GUNTHERODT HJ STAUB J BANGE K
Citation: W. Gutmannsbauer et al., SURFACE-MORPHOLOGY AND ROUGHNESS OF TIO2 THIN-FILMS INVESTIGATED WITHSCANNING FORCE MICROSCOPY, Helvetica Physica Acta, 66(7-8), 1993, pp. 877-878
Risultati: 1-18 |