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Results: 1-12 |
Results: 12
MORPHOLOGICAL INVESTIGATION OF POROUS SAMPLES BY RESONANT BACKSCATTERING SPECTROMETRY
Authors: PASZTI F SZILAGYI E HORVATH ZE MANUABA A BATTISTIG G HAJNAL Z VAZSONYI E
Citation: F. Paszti et al., MORPHOLOGICAL INVESTIGATION OF POROUS SAMPLES BY RESONANT BACKSCATTERING SPECTROMETRY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 533-539
NARROW NUCLEAR-RESONANCE POSITION OR CROSS-SECTION SHAPE MEASUREMENTSWITH A HIGH-PRECISION COMPUTER-CONTROLLED BEAM ENERGY SCANNING SYSTEM
Authors: AMSEL G DARTEMARE E BATTISTIG G GIRARD E GOSSET LG REVESZ P
Citation: G. Amsel et al., NARROW NUCLEAR-RESONANCE POSITION OR CROSS-SECTION SHAPE MEASUREMENTSWITH A HIGH-PRECISION COMPUTER-CONTROLLED BEAM ENERGY SCANNING SYSTEM, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 545-550
GRAZING IRRADIATION OF POROUS SILICON BY 500 KEV HE IONS
Authors: MANUABA A PASZTI F BATTISTIG G ORTEGA C GROSMAN A
Citation: A. Manuaba et al., GRAZING IRRADIATION OF POROUS SILICON BY 500 KEV HE IONS, Vacuum, 50(3-4), 1998, pp. 349-351
BACKSIDE ALUMINISATION EFFECTS ON SOLAR-CELL PERFORMANCE
Authors: MAKARO Z BATTISTIG G HORVATH ZE LIKONEN J BARSONY I
Citation: Z. Makaro et al., BACKSIDE ALUMINISATION EFFECTS ON SOLAR-CELL PERFORMANCE, Vacuum, 50(3-4), 1998, pp. 481-485
A CHARACTERIZATION OF THE MORPHOLOGY OFF POROUS SILICON FILMS BY PROTON ENERGY-LOSS FLUCTUATION MEASUREMENTS WITH A NARROW RESONANCE IN THEN-15(P,ALPHA-GAMMA)C-12 REACTION
Authors: AMSEL G DARTEMARE E BATTISTIG G MORAZZANI V ORTEGA C
Citation: G. Amsel et al., A CHARACTERIZATION OF THE MORPHOLOGY OFF POROUS SILICON FILMS BY PROTON ENERGY-LOSS FLUCTUATION MEASUREMENTS WITH A NARROW RESONANCE IN THEN-15(P,ALPHA-GAMMA)C-12 REACTION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 122(1), 1997, pp. 99-112
CHANNELING-LIKE EFFECTS DUE TO THE MACROSCOPIC STRUCTURE OF POROUS SILICON
Authors: HAJNAL Z SZILAGYI E PASZTI F BATTISTIG G
Citation: Z. Hajnal et al., CHANNELING-LIKE EFFECTS DUE TO THE MACROSCOPIC STRUCTURE OF POROUS SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 617-621
CHANNELING EXPERIMENTS ON POROUS SILICON BEFORE AND AFTER IMPLANTATION
Authors: BATTISTIG G SCHILLER V SZILAGYI E VAZSONYI E
Citation: G. Battistig et al., CHANNELING EXPERIMENTS ON POROUS SILICON BEFORE AND AFTER IMPLANTATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 654-658
DEGRADATION OF VERY THIN GATE DIELECTRICS FOR MOS STRUCTURES DUE TO THROUGH-OXIDE ION-IMPLANTATION
Authors: BAUMVOL IJR STEDILE FC RIGO S GANEM JJ TRIMAILLE I BATTISTIG G LHOIR A SCHULTE WH BECKER HW
Citation: Ijr. Baumvol et al., DEGRADATION OF VERY THIN GATE DIELECTRICS FOR MOS STRUCTURES DUE TO THROUGH-OXIDE ION-IMPLANTATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 96(1-2), 1995, pp. 92-98
IBA STUDY OF THE GROWTH MECHANISMS OF VERY THIN SILICON-OXIDE FILMS -THE EFFECT OF WAFER CLEANING
Authors: STEDILE FC BAUMVOL IJR GANEM JJ RIGO S TRIMAILLE I BATTISTIG G SCHULTE WH BECKER HW
Citation: Fc. Stedile et al., IBA STUDY OF THE GROWTH MECHANISMS OF VERY THIN SILICON-OXIDE FILMS -THE EFFECT OF WAFER CLEANING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 248-254
HIGH-RESOLUTION LOW-ENERGY RESONANCE DEPTH PROFILING OF O-18 IN NEAR-SURFACE ISOTOPIC TRACING STUDIES
Authors: BATTISTIG G AMSEL G TRIMAILLE I GANEM JJ RIGO S STEDILE FC BAUMVOL IJR SCHULTE WH BECKER HW
Citation: G. Battistig et al., HIGH-RESOLUTION LOW-ENERGY RESONANCE DEPTH PROFILING OF O-18 IN NEAR-SURFACE ISOTOPIC TRACING STUDIES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 326-330
MULTIPLE-SCATTERING INDUCED RESOLUTION LIMITS IN GRAZING-INCIDENCE RESONANCE DEPTH PROFILING
Authors: BATTISTIG G AMSEL G DARTEMARE E LHOIR A
Citation: G. Battistig et al., MULTIPLE-SCATTERING INDUCED RESOLUTION LIMITS IN GRAZING-INCIDENCE RESONANCE DEPTH PROFILING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 572-578
ION-BEAM ANALYSIS - PROCEEDINGS OF THE 11TH INTERNATIONAL-CONFERENCE ON ION-BEAM ANALYSIS BALATONFURED, HUNGARY, JULY 5-9, 1993 - PREFACE
Authors: GYULAY J PASZTI F LOHNER T BATTISTIG G
Citation: J. Gyulay et al., ION-BEAM ANALYSIS - PROCEEDINGS OF THE 11TH INTERNATIONAL-CONFERENCE ON ION-BEAM ANALYSIS BALATONFURED, HUNGARY, JULY 5-9, 1993 - PREFACE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 180000007-180000008
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