ACNP - Italian Periodicals Catalogue

AAAAAA

ITA
ENG

Results: 1-9 |

Results: 9

STRUCTURAL CHARACTERIZATION OF A GAAS SURFACE WIRE STRUCTURE BY TRIPLE AXIS X-RAY GRAZING-INCIDENCE DIFFRACTION

Authors: DAROWSKI N PASCHKE K PIETSCH U WANG K FORCHEL A LUBBERT D BAUMBACH T

Citation: N. Darowski et al., STRUCTURAL CHARACTERIZATION OF A GAAS SURFACE WIRE STRUCTURE BY TRIPLE AXIS X-RAY GRAZING-INCIDENCE DIFFRACTION, Physica. B, Condensed matter, 248, 1998, pp. 104-108

X-RAY REFLECTION BY MULTILAYER SURFACE GRATINGS

Authors: MIKULIK P BAUMBACH T

Citation: P. Mikulik et T. Baumbach, X-RAY REFLECTION BY MULTILAYER SURFACE GRATINGS, Physica. B, Condensed matter, 248, 1998, pp. 381-386

THIN-LAYERS AND MULTILAYERS OF POROUS SILICON - X-RAY-DIFFRACTION INVESTIGATION

Authors: BUTTARD D BELLET D DOLINO G BAUMBACH T

Citation: D. Buttard et al., THIN-LAYERS AND MULTILAYERS OF POROUS SILICON - X-RAY-DIFFRACTION INVESTIGATION, Journal of applied physics, 83(11), 1998, pp. 5814-5822

INPLANE STRAIN AND STRAIN RELAXATION IN LATERALLY PATTERNED PERIODIC ARRAYS OF SI SIGE QUANTUM WIRES AND DOT ARRAYS/

Authors: DAROWSKI N PIETSCH U ZHUANG Y ZERLAUTH S BAUER G LUBBERT D BAUMBACH T

Citation: N. Darowski et al., INPLANE STRAIN AND STRAIN RELAXATION IN LATERALLY PATTERNED PERIODIC ARRAYS OF SI SIGE QUANTUM WIRES AND DOT ARRAYS/, Applied physics letters, 73(6), 1998, pp. 806-808

IDENTIFICATION OF A BURIED SINGLE-QUANTUM-WELL WITHIN SURFACE STRUCTURED SEMICONDUCTORS USING DEPTH RESOLVED X-RAY GRAZING-INCIDENCE DIFFRACTION

Authors: DAROWSKI N PASCHKE K PIETSCH U WANG KH FORCHEL A BAUMBACH T ZEIMER U

Citation: N. Darowski et al., IDENTIFICATION OF A BURIED SINGLE-QUANTUM-WELL WITHIN SURFACE STRUCTURED SEMICONDUCTORS USING DEPTH RESOLVED X-RAY GRAZING-INCIDENCE DIFFRACTION, Journal of physics. D, Applied physics, 30(16), 1997, pp. 55-59

X-RAY-DIFFRACTION INVESTIGATION OF POROUS SILICON SUPERLATTICES

Authors: BUTTARD D BELLET D BAUMBACH T

Citation: D. Buttard et al., X-RAY-DIFFRACTION INVESTIGATION OF POROUS SILICON SUPERLATTICES, Thin solid films, 276(1-2), 1996, pp. 69-72

INTERFACE ROUGHNESS IN SURFACE-SENSITIVE X-RAY-METHODS

Authors: HOLY V BAUMBACH T BESSIERE M

Citation: V. Holy et al., INTERFACE ROUGHNESS IN SURFACE-SENSITIVE X-RAY-METHODS, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 220-226

EPITAXIAL-GROWTH AND CHARACTERIZATION OF Y2CO17(0001) THIN-FILMS DEPOSITED ON W(110)

Authors: ROBAUT F MILKULIK P CHERIEF N MCGRATH OFK GIVORD D BAUMBACH T VEUILLEN JY

Citation: F. Robaut et al., EPITAXIAL-GROWTH AND CHARACTERIZATION OF Y2CO17(0001) THIN-FILMS DEPOSITED ON W(110), Journal of applied physics, 78(2), 1995, pp. 997-1003

NONSPECULAR X-RAY REFLECTION FROM ROUGH MULTILAYERS

Authors: HOLY V BAUMBACH T

Citation: V. Holy et T. Baumbach, NONSPECULAR X-RAY REFLECTION FROM ROUGH MULTILAYERS, Physical review. B, Condensed matter, 49(15), 1994, pp. 10668-10676

Risultati: 1-9 |