AAAAAA
Results: 1-25/35
Authors:
BENGTSSON S
Citation: S. Bengtsson, FROM THE EDITORIAL SECRETARY (INTRODUCTION TO CURRENT ISSUE), Moderna sprak, 92(1), 1998, pp. 2-2
Authors:
JAUHIAINEN A
WESTBERG D
BENGTSSON S
Citation: A. Jauhiainen et al., EFFECT OF AN INHOMOGENEOUS INSULATING FILM ON THE CAPACITANCE OF METAL-INSULATOR-SEMICONDUCTOR STRUCTURES, Journal of applied physics, 84(7), 1998, pp. 3960-3965
Authors:
HERMANSSON K
GREY F
BENGTSSON S
SODERVALL U
Citation: K. Hermansson et al., ULTRACLEAN SI SI INTERFACE FORMATION BY SURFACE PREPARATION AND DIRECT BONDING IN ULTRAHIGH-VACUUM/, Journal of the Electrochemical Society, 145(5), 1998, pp. 1645-1649
Authors:
LJUNGBERG K
GREY F
BENGTSSON S
Citation: K. Ljungberg et al., FORMATION OF DIRECTLY BONDED SI SI INTERFACES IN ULTRA-HIGH-VACUUM/, Applied surface science, 117, 1997, pp. 813-819
Authors:
ENGSTROM O
BENGTSSON S
Citation: O. Engstrom et S. Bengtsson, INFOS97 - PROCEEDINGS OF THE 10TH BIENNIAL CONFERENCE ON INSULATING FILMS ON SEMICONDUCTORS - JUNE 11-14, 1997 - STENUNGSUND, SWEDEN - PREFACE, Microelectronic engineering, 36(1-4), 1997, pp. 7-7
Authors:
ERICSSON P
BENGTSSON S
SKARP J
Citation: P. Ericsson et al., PROPERTIES OF AL2O3-FILMS DEPOSITED ON SILICON BY ATOMIC LAYER EPITAXY, Microelectronic engineering, 36(1-4), 1997, pp. 91-94
Authors:
EKLIND Y
BECKFRIIS B
BENGTSSON S
EJLERTSSON J
KIRCHMANN H
MATHISEN B
NORDKVIST E
SONESSON U
SVENSSON BH
TORSTENSSON L
Citation: Y. Eklind et al., CHEMICAL CHARACTERIZATION OF SOURCE-SEPARATED ORGANIC HOUSEHOLD WASTES, Swedish Journal of Agricultural Research, 27(4), 1997, pp. 167-178
Authors:
GROUNES M
LYSELL G
BENGTSSON S
Citation: M. Grounes et al., FUEL RESEARCH-AND-DEVELOPMENT AT STUDSVIK .2. GENERAL STUDIES OF FUELBEHAVIOR INCLUDING PELLET-CLADDING INTERACTION, Nuclear Engineering and Design, 168(1-3), 1997, pp. 151-166
Authors:
BENGTSSON S
Citation: S. Bengtsson, FROM THE EDITORIAL SECRETARY + A NEW EDITORIAL SECRETARY FOR 'MODERNASPRAK', Moderna sprak, 91(1), 1997, pp. 1-1
Authors:
JAUHIAINEN A
BENGTSSON S
ENGSTROM O
Citation: A. Jauhiainen et al., STEADY-STATE AND TRANSIENT CURRENT TRANSPORT IN UNDOPED POLYCRYSTALLINE DIAMOND FILMS, Journal of applied physics, 82(10), 1997, pp. 4966-4976
Authors:
ERICSSON P
BENGTSSON S
Citation: P. Ericsson et S. Bengtsson, INTERNAL OXIDATION OF LOW-DOSE SEPARATION BY IMPLANTED OXYGEN WAFERS IN DIFFERENT OXYGEN NITROGEN MIXTURES/, Applied physics letters, 71(16), 1997, pp. 2310-2312
Authors:
BENGTSSON S
BERGH M
CHOUMAS M
OLESEN C
JEPPSON KO
Citation: S. Bengtsson et al., APPLICATIONS OF ALUMINUM NITRIDE FILMS DEPOSITED BY REACTIVE SPUTTERING TO SILICON-ON-INSULATOR MATERIALS, JPN J A P 1, 35(8), 1996, pp. 4175-4181
Authors:
LOWDIN E
ODENHOLT I
BENGTSSON S
CARS O
Citation: E. Lowdin et al., PHARMACODYNAMIC EFFECTS OF SUB-MICS OF BENZYLPENICILLIN AGAINST STREPTOCOCCUS-PYOGENES IN A NEWLY DEVELOPED IN-VITRO KINETIC-MODEL, Antimicrobial agents and chemotherapy, 40(11), 1996, pp. 2478-2482
Authors:
BENGTSSON S
BERGLOF T
SJOQVIST T
Citation: S. Bengtsson et al., PREDICTING THE LEACHABILITY OF PESTICIDES FROM SOILS USING NEAR-INFRARED REFLECTANCE, Journal of agricultural and food chemistry, 44(8), 1996, pp. 2260-2265
Authors:
LJUNGBERG K
JANSSON U
BENGTSSON S
SODERBARG A
Citation: K. Ljungberg et al., MODIFICATION OF SILICON SURFACES WITH H2SO4-H2O2-HF AND HNO3-HF FOR WAFER BONDING APPLICATIONS, Journal of the Electrochemical Society, 143(5), 1996, pp. 1709-1714
Authors:
EDHOLM B
SODERBARG A
BENGTSSON S
Citation: B. Edholm et al., RELIABILITY EVALUATION OF MANUFACTURING PROCESSES FOR BIPOLAR AND MOSDEVICES ON SILICON-ON-DIAMOND MATERIALS, Journal of the Electrochemical Society, 143(4), 1996, pp. 1326-1334
Authors:
ERICSSON P
BENGTSSON S
Citation: P. Ericsson et S. Bengtsson, INFLUENCE OF SC-1 SC-2 CLEANING ON WAFER-BONDED SILICON DIOXIDE STRUCTURES/, Journal of the Electrochemical Society, 143(11), 1996, pp. 3722-3727
Authors:
BENGTSSON S
LJUNGBERG K
VEDDE J
Citation: S. Bengtsson et al., THE INFLUENCE OF WAFER DIMENSIONS ON THE CONTACT WAVE VELOCITY IN SILICON-WAFER BONDING, Applied physics letters, 69(22), 1996, pp. 3381-3383
Authors:
NUNGU KS
OLERUD C
REHNBERG L
LARSSON S
NORDELL P
ALLVIN I
BENGTSSON S
WALLINDER L
HEDIN G
Citation: Ks. Nungu et al., PROPHYLAXIS WITH ORAL CEFADROXIL VERSUS INTRAVENOUS CEFUROXIME IN TROCHANTERIC FRACTURE SURGERY - A CLINICAL MULTICENTER STUDY, Archives of orthopaedic and trauma surgery, 114(6), 1995, pp. 303-307
Authors:
BENGTSSON S
RAMBERG A
Citation: S. Bengtsson et A. Ramberg, SOLID-PHASE EXTRACTION OF PESTICIDES FROM SURFACE-WATER USING BULK SORBENTS, Journal of chromatographic science, 33(10), 1995, pp. 554-556
Authors:
ERICSSON P
BENGTSSON S
SODERVALL U
Citation: P. Ericsson et al., INFLUENCE OF PREBONDING CLEANING ON THE ELECTRICAL-PROPERTIES OF THE BURIED OXIDE OF BOND-AND-ETCHBACK SILICON-ON-INSULATOR MATERIALS, Journal of applied physics, 78(5), 1995, pp. 3472-3480
Authors:
OURAGH L
JUNEJA RK
BENGTSSON S
Citation: L. Ouragh et al., A NEW GC ALLELE IN HORSES, Hereditas, 122(1), 1995, pp. 91-93
Authors:
BENGTSSON S
ERICSSON P
SODERVALL U
MITANI K
ABE T
Citation: S. Bengtsson et al., CHARGE-CARRIER INJECTION INTO THE BURIED OXIDE OF WAFER-BONDED SILICON-ON-INSULATOR MATERIALS, Journal of the Electrochemical Society, 142(8), 1995, pp. 2721-2726
Authors:
LJUNGBERG K
BACKLUND Y
SODERBARG A
BERGH M
ANDERSSON MO
BENGTSSON S
Citation: K. Ljungberg et al., THE EFFECTS OF HF CLEANING PRIOR TO SILICON-WAFER BONDING, Journal of the Electrochemical Society, 142(4), 1995, pp. 1297-1303
Authors:
AFANASEV VV
ERICSSON P
BENGTSSON S
ANDERSSON MO
Citation: Vv. Afanasev et al., WAFER BONDING INDUCED DEGRADATION OF THERMAL SILICON DIOXIDE LAYERS ON SILICON, Applied physics letters, 66(13), 1995, pp. 1653-1655