Authors: BILENKO DI BELOBROVAYA OY GALISHNIKOVA YN ZHARKOVA EA KAZANOVA NP KOLDOBANOVA OY KHASINA EI

Citation: Di. Bilenko et al., PROPERTIES OF PERIODIC ALPHA-SI-H A-SINX-H STRUCTURES OBTAINED BY NITRIDIZATION OF AMORPHOUS-SILICON LAYERS/, Semiconductors, 32(3), 1998, pp. 297-301

Authors: BILENKO DI BELOBROVAYA OY MELNIKOVA TE POLYANSKAYA VP

Citation: Di. Bilenko et al., OPTIMIZATION OF OPTICAL METHODS OF INSPECTION OF TYPE A(3)B(5)-A(1-X)(3)C(X)(3)B(5), Russian journal of nondestructive testing, 31(6), 1995, pp. 423-426

Authors: BILENKO DI DVORKIN BA POLYANSKAYA VP MELNIKOVA TE

Citation: Di. Bilenko et al., AN AUTOMATED PHOTOMETRIC ELLIPSOMETER, Russian journal of nondestructive testing, 31(5), 1995, pp. 350-353

Authors: BILENKO DI GALISHNIKOVA YN ZHARKOVA EA KOLDOBANOVA OY KHASINA EI

Citation: Di. Bilenko et al., CONDUCTIVITY AND OPTICAL-PROPERTIES OF PERIODIC A-SI-H A-SINX-H STRUCTURES/, Semiconductors, 28(12), 1994, pp. 1197-1200