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Results: 1-9 |
Results: 9
CO-TESTING - GRANTING TESTABILITY IN A CODESIGN ENVIRONMENT
Authors: BUONANNO G SAMI M
Citation: G. Buonanno et M. Sami, CO-TESTING - GRANTING TESTABILITY IN A CODESIGN ENVIRONMENT, Integrated computer-aided engineering, 5(1), 1998, pp. 7-18
THE EFFECTIVE THERMAL-CONDUCTIVITY OF A POROUS-MEDIUM WITH INTERCONNECTED PARTICLES
Authors: BUONANNO G CAROTENUTO A
Citation: G. Buonanno et A. Carotenuto, THE EFFECTIVE THERMAL-CONDUCTIVITY OF A POROUS-MEDIUM WITH INTERCONNECTED PARTICLES, International journal of heat and mass transfer, 40(2), 1997, pp. 393-405
FSMTEST - FUNCTIONAL TEST-GENERATION FOR SEQUENTIAL-CIRCUITS
Authors: BUONANNO G FUMMI F SCIUTO D LOMBARDI F
Citation: G. Buonanno et al., FSMTEST - FUNCTIONAL TEST-GENERATION FOR SEQUENTIAL-CIRCUITS, Integration, 20(3), 1996, pp. 303-325
EFFECT OF RADIATIVE AND CONVECTIVE HEAT-TRANSFER ON THERMAL TRANSIENTS IN POWER-CABLES
Authors: BUONANNO G CAROTENUTO A DELLLSOLA M VILLACCI D
Citation: G. Buonanno et al., EFFECT OF RADIATIVE AND CONVECTIVE HEAT-TRANSFER ON THERMAL TRANSIENTS IN POWER-CABLES, IEE proceedings. Generation, transmission and distribution, 142(4), 1995, pp. 436-444
A WAFER LEVEL TESTABILITY APPROACH BASED ON AN IMPROVED SCAN INSERTION TECHNIQUE
Authors: BOLCHINI C BUONANNO G FERRANDI F SCIUTO D BOMBANA M CAVALLORO P
Citation: C. Bolchini et al., A WAFER LEVEL TESTABILITY APPROACH BASED ON AN IMPROVED SCAN INSERTION TECHNIQUE, IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging, 18(3), 1995, pp. 438-447
TIES - A TESTABILITY INCREASE EXPERT-SYSTEM FOR VLSI DESIGN
Authors: BUONANNO G FUMMI F SCIUTO D
Citation: G. Buonanno et al., TIES - A TESTABILITY INCREASE EXPERT-SYSTEM FOR VLSI DESIGN, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 6(2), 1995, pp. 203-217
A COMPARISON OF IDEAL AND REAL MOIST AIR MODELS FOR CALCULATING HUMIDITY RATIO AND RELATIVE-HUMIDITY IN THE 213.15 TO 473.15K RANGE AND UP TO A PRESSURE OF 1-MPA
Authors: BUONANNO G CAROTENUTO AA CROVINI L DELLISOLA M
Citation: G. Buonanno et al., A COMPARISON OF IDEAL AND REAL MOIST AIR MODELS FOR CALCULATING HUMIDITY RATIO AND RELATIVE-HUMIDITY IN THE 213.15 TO 473.15K RANGE AND UP TO A PRESSURE OF 1-MPA, International journal of thermophysics, 15(3), 1994, pp. 483-504
INNOVATIVE STRUCTURES FOR CMOS COMBINATIONAL GATES SYNTHESIS
Authors: BUONANNO G SCIUTO D STEFANELLI R
Citation: G. Buonanno et al., INNOVATIVE STRUCTURES FOR CMOS COMBINATIONAL GATES SYNTHESIS, I.E.E.E. transactions on computers, 43(4), 1994, pp. 385-399
FAULT-DETECTION IN TFCMOS DFCMOS COMBINATIONAL GATES
Authors: BUONANNO G LOMBARDI F SCIUTO D SHEN YN
Citation: G. Buonanno et al., FAULT-DETECTION IN TFCMOS DFCMOS COMBINATIONAL GATES, Integration, 15(2), 1993, pp. 201-227
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