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Authors: DERBALI MB MEDDEB J MAAREF H BUTTARD D ABRAHAM P MONTEIL Y

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Authors: BUTTARD D BELLET D DOLINO G BAUMBACH T

Citation: D. Buttard et al., THIN-LAYERS AND MULTILAYERS OF POROUS SILICON - X-RAY-DIFFRACTION INVESTIGATION, Journal of applied physics, 83(11), 1998, pp. 5814-5822

Authors: BUTTARD D SCHOISSWOHL M CANTIN JL VONBARDELEBEN HJ

Citation: D. Buttard et al., X-RAY-DIFFRACTION AND ELECTRON-MICROSCOPY INVESTIGATION OF POROUS SI1-XGEX, Thin solid films, 297(1-2), 1997, pp. 233-236

Authors: BUTTARD D BELLET D BAUMBACH T

Citation: D. Buttard et al., X-RAY-DIFFRACTION INVESTIGATION OF POROUS SILICON SUPERLATTICES, Thin solid films, 276(1-2), 1996, pp. 69-72

Authors: BUTTARD D BELLET D DOLINO G

Citation: D. Buttard et al., X-RAY-DIFFRACTION INVESTIGATION OF THE ANODIC-OXIDATION OF POROUS SILICON, Journal of applied physics, 79(10), 1996, pp. 8060-8070