Authors: Samanta, SK Maikap, S Bera, LK Banerjee, HD Maiti, CK

Citation: Sk. Samanta et al., Effect of post-oxidation annealing on the electrical properties and oxynitride films of deposited oxide on strained-Si0.82Ge0.18 layers, SEMIC SCI T, 16(8), 2001, pp. 704-707

Authors: Chatterjee, S Samanta, SK Banerjee, HD Maiti, CK

Citation: S. Chatterjee et al., Metallo-organic compound-based plasma enhanced CVD of ZrO2 films for microelectronic applications, B MATER SCI, 24(6), 2001, pp. 579-582

Authors: Chatterjee, S Samanta, SK Banerjee, HD Maiti, CK

Citation: S. Chatterjee et al., Deposition of high-k ZrO2 films on strained SiGe layers using microwave plasma, ELECTR LETT, 37(6), 2001, pp. 390-392

Authors: Nayak, A Banerjee, HD

Citation: A. Nayak et Hd. Banerjee, X-ray photoelectron spectra of Zn3P2-Cd3P2 alloy semiconducting thin films, MATER CH PH, 60(1), 1999, pp. 95-98

Authors: Nayak, A Banerjee, HD

Citation: A. Nayak et Hd. Banerjee, X-ray photoelectron spectroscopy of zinc phosphide thin film, APPL SURF S, 148(3-4), 1999, pp. 205-210