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Results:
1-12
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Results: 12
Authors:
Stapel, D
Benninghoven, A
Citation: D. Stapel et A. Benninghoven, Secondary ion emission from phosphatidic acid sandwich films under atomic and molecular primary ion bombardment, APPL SURF S, 183(3-4), 2001, pp. 301-303
Authors:
Stapel, D
Benninghoven, A
Citation: D. Stapel et A. Benninghoven, Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces, APPL SURF S, 174(3-4), 2001, pp. 261-270
Authors:
Tidwell, CD
Castner, DG
Golledge, SL
Ratner, BD
Meyer, K
Hagenhoff, B
Benninghoven, A
Citation: Cd. Tidwell et al., Static time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films, SURF INT AN, 31(8), 2001, pp. 724-733
Authors:
Schnieders, A
Mollers, R
Benninghoven, A
Citation: A. Schnieders et al., Molecular secondary particle emission from molecular overlayers under 10 keV Ar+ primary ion bombardment, SURF SCI, 471(1-3), 2001, pp. 170-184
Authors:
Bourdos, N
Kollmer, F
Benninghoven, A
Sieber, M
Galla, HJ
Citation: N. Bourdos et al., Imaging of domain structures in a one-component lipid monolayer by time-of-flight secondary ion mass spectrometry, LANGMUIR, 16(4), 2000, pp. 1481-1484
Authors:
Rading, D
Kersting, R
Benninghoven, A
Citation: D. Rading et al., Secondary ion emission from molecular overlayers: Thiols on gold, J VAC SCI A, 18(2), 2000, pp. 312-319
Authors:
Stapel, D
Thiemann, M
Benninghoven, A
Citation: D. Stapel et al., Secondary ion emission from polymethacrylate LB-layers under 0.5-11 keV atomic and molecular primary ion bombardment, APPL SURF S, 158(3-4), 2000, pp. 362-374
Authors:
Bourdos, N
Kollmer, F
Benninghoven, A
Ross, M
Sieber, M
Galla, HJ
Citation: N. Bourdos et al., Analysis of lung surfactant model systems with time-of-flight secondary ion mass spectrometry, BIOPHYS J, 79(1), 2000, pp. 357-369
Authors:
Schnieders, A
Benninghoven, A
Citation: A. Schnieders et A. Benninghoven, Detection and quantification of metals in organic materials by laser-SNMS with nonresonant multiphoton ionization, ANALYT CHEM, 72(18), 2000, pp. 4289-4295
Authors:
Brox, O
Iltgen, K
Hellweg, S
Benninghoven, A
Citation: O. Brox et al., Determination of silicon oxide layer thickness by time-of-flight secondaryion mass spectroscopy, J VAC SCI B, 17(5), 1999, pp. 2191-2192
Authors:
Stapel, D
Brox, O
Benninghoven, A
Citation: D. Stapel et al., Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment, APPL SURF S, 140(1-2), 1999, pp. 156-167
Authors:
Wolany, D
Fladung, T
Duda, L
Lee, JW
Gantenfort, T
Wiedmann, L
Benninghoven, A
Citation: D. Wolany et al., Combined ToF-SIMS/XPS study of plasma modification and metallization of polyimide, SURF INT AN, 27(7), 1999, pp. 609-617
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