AAAAAA
Results:
1-10
|
Results: 10
Authors:
Castan, H
Duenas, S
Barbolla, J
Blanco, N
Martil, I
Gonzalez-Diaz, G
Citation: H. Castan et al., Electrical characterization of Al/SiNx : H/n and p-In0.53Ga0.47As structures by deep-level transient spectroscopy and conductance transient techniques, JPN J A P 1, 40(7), 2001, pp. 4479-4484
Authors:
Castan, H
Duenas, S
Barbolla, J
Redondo, E
Blanco, N
Martil, I
Gonzalez-Diaz, G
Citation: H. Castan et al., Interface quality study of ECR-deposited and rapid thermal annealed silicon nitride Al/SiNx : H/InP and Al/SiNx : H/In0.53Ga0.47As structures by DLTSand conductance transient techniques, MICROEL REL, 40(4-5), 2000, pp. 845-848
Authors:
Ibanez, J
Cusco, R
Blanco, N
Gonzalez-Diaz, G
Artus, L
Citation: J. Ibanez et al., Generalization of the hydrodynamical model to analyze Raman scattering by free carriers: application to n-InP, J LUMINESC, 87-9, 2000, pp. 595-597
Authors:
Hernandez, S
Marcos, B
Cusco, R
Blanco, N
Gonzalez-Diaz, G
Artus, L
Citation: S. Hernandez et al., Lattice damage study of implanted InGaAs by means of Raman spectroscopy, J LUMINESC, 87-9, 2000, pp. 721-723
Authors:
Cusco, R
Artus, L
Ibanez, J
Blanco, N
Gonzalez-Diaz, G
Rahman, M
Long, AR
Citation: R. Cusco et al., Comparison of Raman-scattering and Shubnikov-de Haas measurements to determine charge density in doped semiconductors, J APPL PHYS, 88(11), 2000, pp. 6567-6570
Authors:
Redondo, E
Blanco, N
Martil, I
Gonzalez-Diaz, G
Pelaez, R
Deunas, S
Castan, H
Citation: E. Redondo et al., Thermally induced improvements on SiNx : H/InP devices, J VAC SCI A, 17(4), 1999, pp. 2178-2182
Authors:
Ibanez, J
Cusco, R
Blanco, N
Gonzalez-Diaz, G
Artus, L
Citation: J. Ibanez et al., Characterization of Mg+-implanted InP by Raman spectroscopy, NUCL INST B, 148(1-4), 1999, pp. 454-458
Authors:
Artus, L
Cusco, R
Ibanez, J
Blanco, N
Gonzalez-Diaz, G
Citation: L. Artus et al., Raman scattering by LO phonon-plasmon coupled modes in n-type InP, PHYS REV B, 60(8), 1999, pp. 5456-5463
Authors:
Otero, R
Gutierrez, JM
Rojas, G
Nunez, V
Diaz, A
Miranda, E
Uribe, AF
Silva, JF
Ospina, JG
Medina, Y
Toro, MF
Garcia, ME
Leon, G
Garcia, H
Lizano, S
De la Torre, J
Marquez, J
Mena, Y
Gonzalez, N
Arenas, LC
Puzon, A
Blanco, N
Sierra, A
Espinal, ME
Arboleda, M
Jimenez, JC
Ramirez, P
Diaz, M
Guzman, MC
Barros, J
Henao, S
Ramirez, A
Macea, U
Lozano, R
Citation: R. Otero et al., A randomized blinded clinical trial of two antivenoms, prepared by caprylic acid or ammonium sulphate fractionation of IgG, in Bothrops and Porthidium snake bites in Colombia: correlation between safety and biochemical characteristics of antivenoms, TOXICON, 37(6), 1999, pp. 895-908
Authors:
Redondo, E
Blanco, N
Martil, I
Gonzalez-Diaz, G
Citation: E. Redondo et al., Low interface trap density in rapid thermally annealed Al/SiNx : H/InP metal-insulator-semiconductor devices, APPL PHYS L, 74(7), 1999, pp. 991-993
Risultati:
1-10
|