Authors: Boateng, KO Takahashi, H Takamatsu, Y

Citation: Ko. Boateng et al., Design of C-testable modified-booth multipliers, IEICE T INF, E83D(10), 2000, pp. 1868-1878

Authors: Boateng, KO Takahashi, H Takamatsu, Y

Citation: Ko. Boateng et al., Diagnosing delay faults in combinational circuits under the ambiguous delay model, IEICE T INF, E82D(12), 1999, pp. 1563-1571

Authors: Takahashi, H Boateng, KO Takamatsu, Y

Citation: H. Takahashi et al., A method of generating tests with linearity property for gate delay faultsin combinational circuits, IEICE T INF, E82D(11), 1999, pp. 1466-1473