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Results:
1-16
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Results: 16
Authors:
Klipp, B
Grass, M
Muller, J
Stolcic, D
Lutz, U
Gantefor, G
Schlenker, T
Boneberg, J
Leiderer, P
Citation: B. Klipp et al., Deposition of mass-selected cluster ions using a pulsed arc cluster-ion source, APPL PHYS A, 73(5), 2001, pp. 547-554
Authors:
Fourrier, T
Schrems, G
Muhlberger, T
Heitz, J
Arnold, N
Bauerle, D
Mosbacher, M
Boneberg, J
Leiderer, P
Citation: T. Fourrier et al., Laser cleaning of polymer surfaces, APPL PHYS A, 72(1), 2001, pp. 1-6
Authors:
Mosbacher, M
Munzer, HJ
Zimmermann, J
Solis, J
Boneberg, J
Leiderer, P
Citation: M. Mosbacher et al., Optical field enhancement effects in laser-assisted particle removal, APPL PHYS A, 72(1), 2001, pp. 41-44
Authors:
Munzer, HJ
Mosbacher, M
Bertsch, M
Zimmermann, J
Leiderer, P
Boneberg, J
Citation: Hj. Munzer et al., Local held enhancement effects for nanostructuring of surfaces, J MICROSC O, 202, 2001, pp. 129-135
Authors:
Ronning, C
Wondratschek, O
Buttner, M
Hofsass, H
Zimmermann, J
Leiderer, P
Boneberg, J
Citation: C. Ronning et al., Superhard, conductive coatings for atomic force microscopy cantilevers, APPL PHYS L, 79(19), 2001, pp. 3053-3055
Authors:
Runge, BU
Bolz, U
Boneberg, J
Bujok, V
Brull, P
Eisenmenger, J
Schiessling, J
Leiderer, P
Citation: Bu. Runge et al., Magneto-optic characterization of defects and study of flux avalanches in high-T-c superconductors down to nanosecond time resolution, LASER PHYS, 10(1), 2000, pp. 53-59
Authors:
Mosbacher, M
Dobler, V
Boneberg, J
Leiderer, P
Citation: M. Mosbacher et al., Universal threshold for the steam laser cleaning of submicron spherical particles from silicon, APPL PHYS A, 70(6), 2000, pp. 669-672
Authors:
Minemoto, S
Muller, J
Gantefor, G
Munzer, HJ
Boneberg, J
Leiderer, P
Citation: S. Minemoto et al., Direct observation of the dynamics of electronic excitations in molecules and small clusters, PHYS REV L, 84(16), 2000, pp. 3554-3557
Authors:
Boneberg, J
Bischof, J
Leiderer, P
Citation: J. Boneberg et al., Nanosecond time-resolved reflectivity determination of the melting of metals upon pulsed laser annealing, OPT COMMUN, 174(1-4), 2000, pp. 145-149
Authors:
Mosbacher, M
Chaoui, N
Siegel, J
Dobler, V
Solis, J
Boneberg, J
Afonso, CN
Leiderer, P
Citation: M. Mosbacher et al., A comparison of ns and ps steam laser cleaning of Si surfaces, APPL PHYS A, 69, 1999, pp. S331-S334
Authors:
Dobler, V
Oltra, R
Boquillon, JP
Mosbacher, M
Boneberg, J
Leiderer, P
Citation: V. Dobler et al., Surface acceleration during dry laser cleaning of silicon, APPL PHYS A, 69, 1999, pp. S335-S337
Authors:
Boneberg, J
Briaudeau, S
Demirplak, Z
Dobler, V
Leiderer, P
Citation: J. Boneberg et al., Two-dimensional pressure measurements with nanosecond time resolution, APPL PHYS A, 69, 1999, pp. S557-S560
Authors:
Pasquet, P
del Coso, R
Boneberg, J
Leiderer, P
Oltra, R
Boquillon, JP
Citation: P. Pasquet et al., Laser cleaning of oxide iron layer: Efficiency enhancement due to electrochemical induced absorptivity change, APPL PHYS A, 69, 1999, pp. S727-S730
Authors:
Burmeister, F
Badowsky, W
Braun, T
Wieprich, S
Boneberg, J
Leiderer, P
Citation: F. Burmeister et al., Colloid monolayer lithography-A flexible approach for nanostructuring of surfaces, APPL SURF S, 145, 1999, pp. 461-466
Authors:
Sommerhalter, C
Matthes, TW
Boneberg, J
Lux-Steiner, CM
Leiderer, P
Citation: C. Sommerhalter et al., Investigation of accepters in p-type WS2 by standard and photo-assisted scanning tunneling microscopy spectroscopy, APPL SURF S, 145, 1999, pp. 564-569
A circuit for measuring the gap voltage of a scanning tunneling microscopeon a nanosecond time scale
Authors:
Ochmann, M
Munzer, HJ
Boneberg, J
Leiderer, P
Citation: M. Ochmann et al., A circuit for measuring the gap voltage of a scanning tunneling microscopeon a nanosecond time scale, REV SCI INS, 70(4), 1999, pp. 2049-2052
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1-16
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