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Results: 1-13 |
Results: 13

Authors: Cresswell, MW Bonevich, JE Allen, RA Guillaume, NMP Giannuzzi, LA Everist, SC Murabito, CE Shea, PJ Linholm, LW
Citation: Mw. Cresswell et al., Electrical linewidth test structures patterned in (100) silicon-on-insulator for use as CD standards, IEEE SEMIC, 14(4), 2001, pp. 356-364

Authors: Fry, RA McMichael, RD Bonevich, JE Chen, PJ Egelhoff, WF Lee, CG
Citation: Ra. Fry et al., Thermal stability of Ta-pinned spin valves, J APPL PHYS, 89(11), 2001, pp. 6825-6827

Authors: Josell, D Wheeler, D Huber, WH Bonevich, JE Moffat, TP
Citation: D. Josell et al., A simple equation for predicting superconformal electrodeposition in submicrometer trenches, J ELCHEM SO, 148(12), 2001, pp. C767-C773

Authors: Gonzalez, EJ Bonevich, JE Stafford, GR White, G Josell, D
Citation: Ej. Gonzalez et al., Thermal transport through thin films: Mirage technique measurements on aluminum/titanium multilayers, J MATER RES, 15(3), 2000, pp. 764-771

Authors: Rotter, LD Vaudin, MD Bonevich, JE Kaiser, DL Park, SO
Citation: Ld. Rotter et al., Correlation of the optical gap of (Ba,Sr)(y)TiO2+y thin films with film composition, THIN SOL FI, 368(1), 2000, pp. 41-48

Authors: McMichael, RD Lee, CG Bonevich, JE Chen, PJ Miller, W Egelhoff, WF
Citation: Rd. Mcmichael et al., Strong anisotropy in thin magnetic films deposited on obliquely sputtered Ta underlayers, J APPL PHYS, 88(9), 2000, pp. 5296-5299

Authors: McMichael, RD Lee, CG Bonevich, JE Chen, PJ Miller, W Egelhoff, WF
Citation: Rd. Mcmichael et al., Strong anisotropy in thin magnetic films deposited on obliquely sputtered Ta underlayers (vol 88, pg 3561, 2000), J APPL PHYS, 88(9), 2000, pp. 5501-5501

Authors: McMichael, RD Lee, CG Bonevich, JE Chen, PJ Miller, W Egelhoff, WF
Citation: Rd. Mcmichael et al., Strong anisotropy in thin magnetic films deposited on obliquely sputtered Ta underlayers, J APPL PHYS, 88(6), 2000, pp. 3561-3564

Authors: Moffat, TP Bonevich, JE Huber, WH Stanishevsky, A Kelly, DR Stafford, GR Josell, D
Citation: Tp. Moffat et al., Superconformal electrodeposition of copper in 500-90 nm features, J ELCHEM SO, 147(12), 2000, pp. 4524-4535

Authors: Josell, D Carter, WC Bonevich, JE
Citation: D. Josell et al., Stability of multilayer structures: Capillary effects, NANOSTR MAT, 12(1-4), 1999, pp. 387-390

Authors: Kaiser, DL Vaudin, MD Rotter, LD Bonevich, JE Levin, I Armstrong, JT Roytburd, AL Schlom, DG
Citation: Dl. Kaiser et al., Effect of film composition on the orientation of (Ba,Sr)TiO3 grains in (Ba,Sr)(y)TiO2+y thin films, J MATER RES, 14(12), 1999, pp. 4657-4666

Authors: Josell, D Bonevich, JE Shao, I Cammarata, RC
Citation: D. Josell et al., Measuring the interface stress: Silver/nickel interfaces, J MATER RES, 14(11), 1999, pp. 4358-4365

Authors: Fanesi, S Pozzi, G Bonevich, JE
Citation: S. Fanesi et al., Influence of core misalignment and distortion on the Fresnel and holographic images of superconducting fluxons, PHYS REV B, 59(2), 1999, pp. 1426-1431
Risultati: 1-13 |