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Results: 1-8 |
Results: 8

Authors: Benouattas, N Halimi, R Bouabellou, A Mosser, A
Citation: N. Benouattas et al., Effect of implanted phosphorus on silicide formation in the Cr/Si(111) system, THIN SOL FI, 385(1-2), 2001, pp. 61-65

Authors: Bouabellou, A Halimi, R Mirouh, K Labbani, R Djebien, R Mosser, A
Citation: A. Bouabellou et al., Silicidation in chromium-amorphous silicon multilayer films, THIN SOL FI, 383(1-2), 2001, pp. 296-298

Authors: Mirouh, K Bouabellou, A Halimi, R Mosser, A Ehret, G Werckman, J
Citation: K. Mirouh et al., Cross-sectional TEM investigations of the influence of P+ ions implanted in the Si substrate on the atomic interdiffusion in the Cr-Si system, MAT SCI E B, 73(1-3), 2000, pp. 116-119

Authors: Benouattas, N Mosser, A Bouabellou, A
Citation: N. Benouattas et al., Etching effect on the texture and the stress of copper layers evaporated on Si(100), MAT SCI E A, 288(2), 2000, pp. 253-256

Authors: Chemam, F Bouabellou, A Halimi, R Mosbah, MF
Citation: F. Chemam et al., Ag layer thickness dependence of magnetic properties in Fe/Ag superlattices, J MAGN MAGN, 211(1-3), 2000, pp. 320-325

Authors: Benouattas, N Mosser, A Raiser, D Faerber, J Bouabellou, A
Citation: N. Benouattas et al., Behaviour of copper atoms in annealed Cu/SiOx/Si systems, APPL SURF S, 153(2-3), 2000, pp. 79-84

Authors: Chemam, F Bouabellou, A Halimi, R
Citation: F. Chemam et al., Effect of substrate temperature on the structural and magnetic properties of Fe/Ag superlattices, THIN SOL FI, 380(1-2), 2000, pp. 266-268

Authors: Benouattas, N Tamaarat, B Bouabellou, A Halimi, R Mosser, A
Citation: N. Benouattas et al., Electrical properties of Cr/Si(p) structures, SOL ST ELEC, 43(2), 1999, pp. 439-446
Risultati: 1-8 |