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Results: 1-11 |
Results: 11
Developments in materials for 157nm photoresists
Authors: Conley, W Dean, K Miller, D Rich, G Graffenberg, V Patel, S Lin, SH Jamieson, A Hung, R Yamada, S Pinnow, M MacDonald, S Chambers, C Osborne, B Patterson, K Somervell, M Trinque, B Tran, HV Cho, S Chiba, T Byers, J Tomas, B Shafer, G DesMarteau, D Klopp, J Frechet, J Sanders, D Grubbs, R Ober, C Korner, H Willson, CG
Citation: W. Conley et al., Developments in materials for 157nm photoresists, SOL ST TECH, 44(10), 2001, pp. 63
157 nm resist materials: Progress report
Authors: Brodsky, C Byers, J Conley, W Hung, R Yamada, S Patterson, K Somervell, M Trinque, B Tran, HV Cho, S Chiba, T Lin, SH Jamieson, A Johnson, H Vander Heyden, T Willson, CG
Citation: C. Brodsky et al., 157 nm resist materials: Progress report, J VAC SCI B, 18(6), 2000, pp. 3396-3401
Study of the fundamental contributions to line edge roughness in a 193 nm,top surface imaging system
Authors: Somervell, MH Fryer, DS Osborn, B Patterson, K Byers, J Willson, CG
Citation: Mh. Somervell et al., Study of the fundamental contributions to line edge roughness in a 193 nm,top surface imaging system, J VAC SCI B, 18(5), 2000, pp. 2551-2559
On the origin of power laws in Internet topologies
Authors: Medina, A Matta, I Byers, J
Citation: A. Medina et al., On the origin of power laws in Internet topologies, COMP COM R, 30(2), 2000, pp. 18-28
Study of resolution limits due to intrinsic bias in chemically amplified photoresists
Authors: Postnikov, SV Stewart, MD Tran, HV Nierode, MA Medeiros, DR Cao, T Byers, J Webber, SE Wilson, CG
Citation: Sv. Postnikov et al., Study of resolution limits due to intrinsic bias in chemically amplified photoresists, J VAC SCI B, 17(6), 1999, pp. 3335-3338
Conduction across the interface between a superconductor and a spin polarized metal
Authors: Soulen, RJ Osofsky, MS Nadgorny, B Ambrose, T Broussard, PR Rubinstein, M Byers, J Tanaka, CT Nowack, J Moodera, JS Laprade, G Barry, A Coey, MD Mukovskii, YM Shulyatev, D Arsenov, A
Citation: Rj. Soulen et al., Conduction across the interface between a superconductor and a spin polarized metal, IEEE APPL S, 9(2), 1999, pp. 3636-3639
Performance characteristics of lithium-ion cells for NASA's Mars 2001 Lander application
Authors: Smart, MC Ratnakumar, BV Whitcanack, L Surampudi, S Byers, J Marsh, R
Citation: Mc. Smart et al., Performance characteristics of lithium-ion cells for NASA's Mars 2001 Lander application, IEEE AES M, 14(11), 1999, pp. 36-42
1998 Chester Rapkin Award for best article in volume 17
Authors: Byers, J
Citation: J. Byers, 1998 Chester Rapkin Award for best article in volume 17, J PLAN ED R, 18(3), 1999, pp. 271-271
Measurement of the spin polarization of LaSrMnO
Authors: Osofsky, MS Nadgorny, B Soulen, RJ Broussard, P Rubinstein, M Byers, J Laprade, G Mukovskii, YM Shulyatev, D Arsenov, A
Citation: Ms. Osofsky et al., Measurement of the spin polarization of LaSrMnO, J APPL PHYS, 85(8), 1999, pp. 5567-5569
Andreev reflection: A new means to determine the spin polarization of ferromagnetic materials
Authors: Soulen, RJ Osofsky, MS Nadgorny, B Ambrose, T Broussard, P Cheng, SF Byers, J Tanaka, CT Nowack, J Moodera, JS Laprade, G Barry, A Coey, MD
Citation: Rj. Soulen et al., Andreev reflection: A new means to determine the spin polarization of ferromagnetic materials, J APPL PHYS, 85(8), 1999, pp. 4589-4591
Procedural outcome and clinical results after stent deployment from the radial approach
Authors: Byers, J Brown, S Robertson, R Smucker, M
Citation: J. Byers et al., Procedural outcome and clinical results after stent deployment from the radial approach, AM J CARD, 84(9), 1999, pp. 1088
Risultati: 1-11 |