Authors:
WANG TH
CHIANG LP
ZOUS NK
CHANG TE
HUANG C
Citation: Th. Wang et al., CHARACTERIZATION OF VARIOUS STRESS-INDUCED OXIDE TRAPS IN MOSFETS BY USING A SUBTHRESHOLD TRANSIENT CURRENT TECHNIQUE, I.E.E.E. transactions on electron devices, 45(8), 1998, pp. 1791-1796
Authors:
WANG TH
CHANG TE
CHIANG LP
WANG CH
ZOUS NK
HUANG CM
Citation: Th. Wang et al., INVESTIGATION OF OXIDE CHARGE TRAPPING AND DETRAPPING IN A MOSFET BY USING A GIDL CURRENT TECHNIQUE, I.E.E.E. transactions on electron devices, 45(7), 1998, pp. 1511-1517
Authors:
CHIANG LP
ZOUS NK
WANG TH
CHANG TE
SHEN KY
HUANG C
Citation: Lp. Chiang et al., FIELD AND TEMPERATURE EFFECTS ON OXIDE CHARGE DETRAPPING IN A METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR BY MEASURING A SUBTHRESHOLDCURRENT TRANSIENT, Applied physics letters, 71(8), 1997, pp. 1068-1070
Authors:
WANG TH
CHANG TE
HUANG CM
YANG JY
CHANG KM
CHIANG LP
Citation: Th. Wang et al., STRUCTURAL EFFECT ON BAND-TRAP-BAND TUNNELING INDUCED DRAIN LEAKAGE IN N-MOSFETS, IEEE electron device letters, 16(12), 1995, pp. 566-568
Authors:
KRISHNASAMY S
CHANG TE
WANG WY
MAKAROFF CA
Citation: S. Krishnasamy et al., ISOLATION AND CHARACTERIZATION OF A NUCLEAR GENE ENCODING MITOCHONDRIAL MALATE-DEHYDROGENASE FROM A UNICELLULAR ALGA CHLAMYDOMONAS-REINHARDTII, Plant physiology, 108(2), 1995, pp. 75-75
Citation: Te. Chang et al., MECHANISMS OF INTERFACE TRAP-INDUCED DRAIN LEAKAGE CURRENT IN OFF-STATE N-MOSFETS, I.E.E.E. transactions on electron devices, 42(4), 1995, pp. 738-743
Authors:
WANG TH
HUANG CM
CHOU PC
CHUNG SSS
CHANG TE
Citation: Th. Wang et al., EFFECTS OF HOT-CARRIER-INDUCED INTERFACE STATE GENERATION IN SUBMICRON LDD MOSFETS, I.E.E.E. transactions on electron devices, 41(9), 1994, pp. 1618-1622
Authors:
WANG TH
HUANG CM
CHANG TE
CHOU JW
CHANG CY
Citation: Th. Wang et al., INTERFACE-TRAP EFFECT ON GATE INDUCED DRAIN LEAKAGE CURRENT IN SUBMICRON N-MOSFETS, I.E.E.E. transactions on electron devices, 41(12), 1994, pp. 2475-2477