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Results:
1-23
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Results: 23
Authors:
FLORO JA
LUCADAMO GA
CHASON E
FREUND LB
SINCLAIR M
TWESTEN RD
HWANG RQ
Citation: Ja. Floro et al., SIGE ISLAND SHAPE TRANSITIONS INDUCED BY ELASTIC REPULSION, Physical review letters, 80(21), 1998, pp. 4717-4720
Authors:
FLORO JA
CHASON E
SINCLAIR MB
FREUND LB
LUCADAMO GA
Citation: Ja. Floro et al., DYNAMIC SELF-ORGANIZATION OF STRAINED ISLANDS DURING SIGE EPITAXIAL-GROWTH, Applied physics letters, 73(7), 1998, pp. 951-953
Authors:
CHASON E
SINCLAIR MB
FLORO JA
HUNTER JA
HWANG RQ
Citation: E. Chason et al., SPECTROSCOPIC LIGHT-SCATTERING FOR REAL-TIME MEASUREMENTS OF THIN-FILM AND SURFACE EVOLUTION, Applied physics letters, 72(25), 1998, pp. 3276-3278
Authors:
CHASON E
MAYER TM
Citation: E. Chason et Tm. Mayer, THIN-FILM AND SURFACE CHARACTERIZATION BY SPECULAR X-RAY REFLECTIVITY, Critical reviews in solid state and materials sciences, 22(1), 1997, pp. 1-67
Authors:
FLORO JA
CHASON E
LEE SR
TWESTEN RD
HWANG RQ
FREUND LB
Citation: Ja. Floro et al., REAL-TIME STRESS EVOLUTION DURING SI1-XGEX HETEROEPITAXY - DISLOCATIONS, ISLANDING, AND SEGREGATION, Journal of electronic materials, 26(9), 1997, pp. 969-979
Authors:
CHASON E
KELLERMAN BK
Citation: E. Chason et Bk. Kellerman, MONTE-CARLO SIMULATIONS OF ION-ENHANCED ISLAND COARSENING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 127, 1997, pp. 225-229
Authors:
MCLEAN JG
KRISHNAMACHARI B
PEALE DR
CHASON E
SETHNA JP
COOPER BH
Citation: Jg. Mclean et al., DECAY OF ISOLATED SURFACE-FEATURES DRIVEN BY THE GIBBS-THOMSON EFFECTIN AN ANALYTIC MODEL AND A SIMULATION, Physical review. B, Condensed matter, 55(3), 1997, pp. 1811-1823
Authors:
KELLERMAN BK
CHASON E
ADAMS DP
MAYER TM
WHITE JM
Citation: Bk. Kellerman et al., IN-SITU X-RAY REFLECTIVITY INVESTIGATION OF GROWTH AND SURFACE-MORPHOLOGY EVOLUTION DURING FE CHEMICAL-VAPOR-DEPOSITION ON SI(001), Surface science, 375(2-3), 1997, pp. 331-339
Authors:
ADAMS DP
MAYER TM
CHASON E
KELLERMAN BK
SWARTZENTRUBER BS
Citation: Dp. Adams et al., ISLAND STRUCTURE EVOLUTION DURING CHEMICAL-VAPOR-DEPOSITION, Surface science, 371(2-3), 1997, pp. 445-454
Authors:
FLORO JA
CHASON E
TWESTEN RD
HWANG RQ
FREUND LB
Citation: Ja. Floro et al., SIGE COHERENT ISLANDING AND STRESS-RELAXATION IN THE HIGH-MOBILITY REGIME, Physical review letters, 79(20), 1997, pp. 3946-3949
Authors:
CHASON E
PICRAUX ST
POATE JM
BORLAND JO
CURRENT MI
DELARUBIA TD
EAGLESHAM DJ
HOLLAND OW
LAW ME
MAGEE CW
MAYER JW
MELNGAILIS J
TASCH AF
Citation: E. Chason et al., ION-BEAMS IN SILICON PROCESSING AND CHARACTERIZATION, Journal of applied physics, 81(10), 1997, pp. 6513-6561
Authors:
FLORO JA
CHASON E
LEE SR
PETERSEN GA
Citation: Ja. Floro et al., BIAXIAL MODULI OF COHERENT SI1-XGEX FILMS ON SI(001), Applied physics letters, 71(12), 1997, pp. 1694-1696
Authors:
FLORO JA
CHASON E
Citation: Ja. Floro et E. Chason, MEASURING GE SEGREGATION BY REAL-TIME STRESS MONITORING DURING SI1-XGEX MOLECULAR-BEAM EPITAXY, Applied physics letters, 69(25), 1996, pp. 3830-3832
Authors:
KELLERMAN BK
FLORO JA
CHASON E
BRICE DK
PICRAUX ST
WHITE JM
Citation: Bk. Kellerman et al., DEFECT PRODUCTION AND RECOMBINATION DURING LOW-ENERGY ION PROCESSING, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 972-978
Authors:
MATUTINOVICKRSTELJ Z
CHASON E
STURM JC
Citation: Z. Matutinovickrstelj et al., GROWTH PRESSURE EFFECTS ON SI SI1-XGEX CHEMICAL-VAPOR-DEPOSITION/, Journal of electronic materials, 24(6), 1995, pp. 725-730
Authors:
ADAMS DP
TEDDER LL
MAYER TM
SWARTZENTRUBER BS
CHASON E
Citation: Dp. Adams et al., INITIAL-STAGES OF FE CHEMICAL-VAPOR-DEPOSITION ONTO SI(100), Physical review letters, 74(25), 1995, pp. 5088-5091
Authors:
FLORO JA
KELLERMAN BK
CHASON E
PICRAUX ST
BRICE DK
HORN KM
Citation: Ja. Floro et al., SURFACE DEFECT PRODUCTION ON GE(001) DURING LOW-ENERGY ION-BOMBARDMENT, Journal of applied physics, 77(6), 1995, pp. 2351-2357
Authors:
KELLERMAN BK
CHASON E
FLORO JA
PICRAUX ST
WHITE JM
Citation: Bk. Kellerman et al., THE ROLE OF TRANSIENT ION-INDUCED DEFECTS IN ION-BEAM-ASSISTED GROWTH, Applied physics letters, 67(12), 1995, pp. 1703-1705
Authors:
CHASON E
CHASON M
Citation: E. Chason et M. Chason, IN-SITU X-RAY REFLECTIVITY MEASUREMENTS OF THIN-FILM STRUCTURAL EVOLUTION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 1565-1568
Authors:
HORN KM
CHASON E
TSAO JY
FLORO JA
PICRAUX ST
Citation: Km. Horn et al., OXYGEN ROUGHENING OF GE(001) SURFACES, Surface science, 320(1-2), 1994, pp. 174-184
Authors:
CHASON E
MAYER TM
KELLERMAN BK
MCILROY DT
HOWARD AJ
Citation: E. Chason et al., ROUGHENING INSTABILITY AND EVOLUTION OF THE GE(001) SURFACE DURING ION SPUTTERING, Physical review letters, 72(19), 1994, pp. 3040-3043
Authors:
MAYER TM
CHASON E
HOWARD AJ
Citation: Tm. Mayer et al., ROUGHENING INSTABILITY AND ION-INDUCED VISCOUS RELAXATION OF SIO2 SURFACES, Journal of applied physics, 76(3), 1994, pp. 1633-1643
Authors:
CHASON E
MAYER TM
MCILROY D
MATZKE CM
Citation: E. Chason et al., ION-BOMBARDMENT OF SIO2 SI AND SI MEASURED BY IN-SITU X-RAY REFLECTIVITY/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 742-746
Risultati:
1-23
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