Citation: C. Rospars et al., ON A FIRST CREEP MODEL FOR A 2D SICF-SIC COMPOSITE, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 250(2), 1998, pp. 264-269
Citation: C. Redon et al., ASSESSMENT OF FIBER ORIENTATION IN REINFORCED-CONCRETE USING FOURIER IMAGE TRANSFORM, Journal of Microscopy, 191, 1998, pp. 258-265
Authors:
BOUDRY C
HERLIN P
COSTER M
SOLA B
CHERMANT JL
Citation: C. Boudry et al., INFLUENCE OF DEBRIS AND AGGREGATES ON IMAGE CYTOMETRY DNA MEASUREMENTOF ARCHIVAL TUMORS, Analytical and quantitative cytology and histology, 19(2), 1997, pp. 153-157
Citation: G. Boitier et al., NANOSTRUCTURE STUDY BY TEM AND HREM OF CARBON-FIBERS IN C-F-SIC COMPOSITES, Journal of materials science letters, 16(16), 1997, pp. 1402-1405
Authors:
BOITIER G
CHERMANT JL
CHERMANT L
DOREAU F
VICENS J
Citation: G. Boitier et al., MORPHOLOGY BY IMAGE-ANALYSIS OF COMPOSITE S WITH CONTINUOUS FIBERS - PRINCIPLES AND RESULTS, Revue de métallurgie, 94(12), 1997, pp. 1517
Citation: J. Vicens et al., MICROSTRUCTURE AND CREEP CHARACTERISTICS OF EXPERIMENTAL SICF-YMAS COMPOSITES, Journal of Microscopy, 185, 1997, pp. 168-178
Citation: J. Vicens et al., MICROSTRUCTURAL CHARACTERIZATION OF SICF YMAS COMPOSITES IN THE AS-RECEIVED STATE AND AFTER THERMOMECHANICAL TESTS/, Composites. Part A, Applied science and manufacturing, 27(9), 1996, pp. 723-727
Citation: Jl. Chermant, 20TH ANNIVERSARY OF THE FRENCH SECTION OF THE INTERNATIONAL-SOCIETY-FOR-STEREOLOGY - FOREWORD, Microscopy microanalysis microstructures, 7(5-6), 1996, pp. 4-4
Authors:
BOUDRY C
COSTER M
HERLIN P
SOLA B
CHERMANT JL
Citation: C. Boudry et al., GLOBAL AND NON PARAMETRIC CLASSIFICATION METHODS USING MATHEMATICAL MORPHOLOGY - APPLICATION TO DNA-PLOIDY MEASUREMENT OF ARCHIVAL SOLID TUMORS, Microscopy microanalysis microstructures, 7(5-6), 1996, pp. 477-484
Citation: M. Coster et al., ROUGHNESS AND IR2 X IR FUNCTION-ANALYSIS - APPLICATIONS IN MATERIAL SCIENCE, Microscopy microanalysis microstructures, 7(5-6), 1996, pp. 533-539
Citation: Jl. Quenech et al., EXAMPLE OF APPLICATION OF PROBABILISTIC MODELS - DETERMINATION OF THEKINETICS PARAMETERS DURING LIQUID-PHASE SINTERING, Microscopy microanalysis microstructures, 7(5-6), 1996, pp. 573-580
Citation: D. Trochim et al., X-RAY-ANALYSIS OF MAGNESIUM DIFFUSION TOW ARDS THE SURFACE OF AN ASGM-0.7 ALUMINUM-ALLOY MADE BY POWDER-METALLURGY, Annales de chimie, 21(6-7), 1996, pp. 531-547
Authors:
DOREAU F
MAUPAS H
KERVADEC D
RUTERANA P
VICENS J
CHERMANT JL
Citation: F. Doreau et al., THE COMPLEXITY OF THE MATRIX MICROSTRUCTURE IN SIC-FIBER-REINFORCED GLASS-CERAMIC COMPOSITES, Journal of the European Ceramic Society, 15(12), 1995, pp. 1235-1247
Citation: J. Vicens et al., THE MICROSTRUCTURE OF EXPERIMENTAL SIC FIBER-REINFORCED YTTRIUM MAGNESIUM ALUMINOSILICATE (SICF-YMAS) MATERIALS, Journal of Microscopy, 177, 1995, pp. 242-250
Authors:
RUTERANA P
KERVADEC D
MAUPAS H
CHERMANT JL
Citation: P. Ruterana et al., MICROSTRUCTURE AND EVOLUTION OF A MAGNESIUM LITHIUM ALUMINOSILICATE MATRIX COMPOSITE, Journal of Microscopy, 177, 1995, pp. 272-278
Authors:
SEBIRELHERMITTE I
VICENS J
CHERMANT JL
LEVALOIS M
PAUMIER E
Citation: I. Sebirelhermitte et al., TEM STUDIES OF DAMAGE-INDUCED IN SICF-SIC COMPOSITES IRRADIATED WITH SWIFT XE IONS, Journal of Materials Science, 30(8), 1995, pp. 2115-2120
Authors:
LHERMITTESEBIRE I
VICENS J
CHERMANT JL
LEVALOIS M
PAUMIER E
Citation: I. Lhermittesebire et al., TRANSMISSION ELECTRON-MICROSCOPY AND HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDIES OF STRUCTURAL DEFECTS INDUCED IN 6H ALPHA-SIC SINGLE-CRYSTALS IRRADIATED BY SWIFT XE IONS, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 69(2), 1994, pp. 237-253