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Authors: CHERMANT JL
Citation: Jl. Chermant, IMAGE-ANALYSIS AND MATHEMATICAL MORPHOLOG Y - AN INTRODUCTION, Revue de métallurgie, 91(2), 1994, pp. 201-209

Authors: COSTER M CHERMANT JL
Citation: M. Coster et Jl. Chermant, MEASUREMENTS ON FUNCTIONS - PARAMETRICAL CHARACTERIZATION OF GRAY TONE LEVELS IMAGES AND APPLICATION TO NONPLANAR SURFACES, Revue de métallurgie, 91(2), 1994, pp. 233-241

Authors: MAUPAS H CHERMANT JL HILLEL R
Citation: H. Maupas et al., THE EFFECT OF NANOSCALE MICROSTRUCTURES ON THE MECHANICAL-BEHAVIOR OFSILICON-CARBON TITANIUM-CARBON COMPOSITES, Materials research bulletin, 29(8), 1994, pp. 895-902

Authors: GOURBILLEAU F MAUPAS H HILLEL R CHERMANT JL
Citation: F. Gourbilleau et al., SILICON-CARBIDE - TITANIUM CARBIDE NANOCOMPOSITES - MICROSTRUCTURAL INVESTIGATION, Materials research bulletin, 29(6), 1994, pp. 673-680

Authors: KERVADEC D ABBE F CHERMANT JL
Citation: D. Kervadec et al., STEADY-STATE CREEP-BEHAVIOR OF 2 CERAMIC COMPOSITES SICF-SIC AND SICF-MLAS, Journal de physique. IV, 3(C7), 1993, pp. 1917-1922

Authors: PRODHOMME M COSTER M CHERMANT JL
Citation: M. Prodhomme et al., MORPHOLOGICAL INVESTIGATION OF CERAMICS FOR CAPACITORS, Journal de physique. IV, 3(C7), 1993, pp. 1389-1392

Authors: LHERMITTESEBIRE I CHERMANT JL LEVALOIS M PAUMIER E VICENS J
Citation: I. Lhermittesebire et al., STUDY OF DEFECTS CREATED BY SWIFT XE IONS IN 6H ALPHA SIC SINGLE-CRYSTALS, Radiation effects and defects in solids, 126(1-4), 1993, pp. 173-176

Authors: QUENECH JL COSTER M CHERMANT JL JEULIN D
Citation: Jl. Quenech et al., STUDY OF THE SINTERING KINETICS WITH THE HELP OF RANDOM SETS MODELS, Revue de métallurgie, 90(5), 1993, pp. 611-622
Risultati: 1-25 | 26-33 |