AAAAAA

   
Results: 1-9 |
Results: 9
AN INFRARED STUDY OF H8SI8O12 CLUSTER ADSORPTION ON SI(100) SURFACES
Authors: ENG J RAGHAVACHARI K STRUCK LM CHABAL YJ BENT BE BANASZAKHOLL MM MCFEELY FR MICHAELS AM FLYNN GW CHRISTMAN SB CHABAN EE WILLIAMS GP RADERMACHER K MANTL S
Citation: J. Eng et al., AN INFRARED STUDY OF H8SI8O12 CLUSTER ADSORPTION ON SI(100) SURFACES, The Journal of chemical physics, 108(20), 1998, pp. 8680-8688
ON THE MECHANISM OF THE HYDROGEN-INDUCED EXFOLIATION OF SILICON
Authors: WELDON MK MARSICO VE CHABAL YJ AGARWAL A EAGLESHAM DJ SAPJETA J BROWN WL JACOBSON DC CAUDANO Y CHRISTMAN SB CHABAN EE
Citation: Mk. Weldon et al., ON THE MECHANISM OF THE HYDROGEN-INDUCED EXFOLIATION OF SILICON, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 1065-1073
VIBRATIONAL STUDY OF SILICON OXIDATION - H2O ON SI(100)
Authors: STRUCK LM ENG J BENT BE FLYNN GW CHABAL YJ CHRISTMAN SB CHABAN EE RAGHAVACHARI K WILLIAMS GP RADERMACHER K MANTL S
Citation: Lm. Struck et al., VIBRATIONAL STUDY OF SILICON OXIDATION - H2O ON SI(100), Surface science, 380(2-3), 1997, pp. 444-454
A VIBRATIONAL STUDY OF ETHANOL ADSORPTION ON SI(100)
Authors: ENG J RAGHAVACHARI K STRUCK LM CHABAL YJ BENT BE FLYNN GW CHRISTMAN SB CHABAN EE WILLIAMS GP RADERMACHER K MANTI S
Citation: J. Eng et al., A VIBRATIONAL STUDY OF ETHANOL ADSORPTION ON SI(100), The Journal of chemical physics, 106(23), 1997, pp. 9889-9898
PHYSICS AND CHEMISTRY OF SILICON-WAFER BONDING INVESTIGATED BY INFRARED-ABSORPTION SPECTROSCOPY
Authors: WELDON MK CHABAL YJ HAMANN DR CHRISTMAN SB CHABAN EE FELDMAN LC
Citation: Mk. Weldon et al., PHYSICS AND CHEMISTRY OF SILICON-WAFER BONDING INVESTIGATED BY INFRARED-ABSORPTION SPECTROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 3095-3106
INFRARED-SPECTROSCOPY AS A PROBE OF FUNDAMENTAL PROCESSES IN MICROELECTRONICS - SILICON-WAFER CLEANING AND BONDING
Authors: WELDON MK MARSICO VE CHABAL YJ HAMANN DR CHRISTMAN SB CHABAN EE
Citation: Mk. Weldon et al., INFRARED-SPECTROSCOPY AS A PROBE OF FUNDAMENTAL PROCESSES IN MICROELECTRONICS - SILICON-WAFER CLEANING AND BONDING, Surface science, 368, 1996, pp. 163-178
SIZE, SHAPE, AND COMPOSITION OF LUMINESCENT SPECIES IN OXIDIZED SI NANOCRYSTALS AND H-PASSIVATED POROUS SI
Authors: SCHUPPLER S FRIEDMAN SL MARCUS MA ADLER DL XIE YH ROSS FM CHABAL YJ HARRIS TD BRUS LE BROWN WL CHABAN EE SZAJOWSKI PF CHRISTMAN SB CITRIN PH
Citation: S. Schuppler et al., SIZE, SHAPE, AND COMPOSITION OF LUMINESCENT SPECIES IN OXIDIZED SI NANOCRYSTALS AND H-PASSIVATED POROUS SI, Physical review. B, Condensed matter, 52(7), 1995, pp. 4910-4925
MONOHYDRIDE STRUCTURES ON CHEMICALLY PREPARED SILICON SURFACES
Authors: JAKOB P CHABAL YJ KUHNKE K CHRISTMAN SB
Citation: P. Jakob et al., MONOHYDRIDE STRUCTURES ON CHEMICALLY PREPARED SILICON SURFACES, Surface science, 302(1-2), 1994, pp. 49-56
SILICON-WAFER BONDING STUDIED BY INFRARED-ABSORPTION SPECTROSCOPY
Authors: FEIJOO D CHABAL YJ CHRISTMAN SB
Citation: D. Feijoo et al., SILICON-WAFER BONDING STUDIED BY INFRARED-ABSORPTION SPECTROSCOPY, Applied physics letters, 65(20), 1994, pp. 2548-2550
Risultati: 1-9 |