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Results: 5

Authors: CIAPPA M MALBERTI P FURCAS P VANZI P
Citation: M. Ciappa et al., A NEW ADAPTIVE AMPLIFIER FOR BIASED ELECTRON-BEAM-INDUCED CURRENT APPLICATIONS, Microelectronics and reliability, 38(6-8), 1998, pp. 889-893

Authors: CIAPPA M NAITANA A VANZI M
Citation: M. Ciappa et al., TRANSIENT STRESSING AND CHARACTERIZATION OF THIN TUNNEL OXIDES, Microelectronics and reliability, 37(10-11), 1997, pp. 1525-1528

Authors: COVA P CIAPPA M FRANCESCHINI G MALBERTI P FANTINI F
Citation: P. Cova et al., THERMAL CHARACTERIZATION OF IGBT POWER MODULES, Microelectronics and reliability, 37(10-11), 1997, pp. 1731-1734

Authors: CIAPPA M MALBERTI P
Citation: M. Ciappa et P. Malberti, PLASTIC-STRAIN OF ALUMINUM INTERCONNECTIONS DURING PULSED OPERATION OF IGBT MULTICHIP MODULES, Quality and reliability engineering international, 12(4), 1996, pp. 297-303

Authors: BIROLINI A CIAPPA M WOLFGANG E
Citation: A. Birolini et al., SPECIAL ISSUE ON ELECTRON AND OPTICAL BEAM TESTING OF ELECTRONIC DEVICES - PROCEEDINGS OF THE 3RD EUROPEAN CONFERENCE ON ELECTRON AND OPTICAL BEAM TESTING OF ELECTRONIC DEVICES, SEPTEMBER 1-3, 1993, ZURICH, SWITZERLAND - PREFACE, Microelectronic engineering, 24(1-4), 1994, pp. 180000007-180000007
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