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Results: 1-18 |
Results: 18
MORPHOLOGY OF POROUS SILICON LAYERS - IMAGE OF ACTIVE-SITES FROM REDUCTIVE DEPOSITION OF COPPER ONTO THE SURFACE
Authors: COULTHARD I SHAM TK
Citation: I. Coulthard et Tk. Sham, MORPHOLOGY OF POROUS SILICON LAYERS - IMAGE OF ACTIVE-SITES FROM REDUCTIVE DEPOSITION OF COPPER ONTO THE SURFACE, Applied surface science, 126(3-4), 1998, pp. 287-291
ELECTRONIC-STRUCTURE OF NI-CU ALLOYS - THE D-ELECTRON CHARGE-DISTRIBUTION
Authors: HSIEH HH CHANG YK PONG WF PIEH JY TSENG PK SHAM TK COULTHARD I NAFTEL SJ LEE JF CHUNG SC TSANG KL
Citation: Hh. Hsieh et al., ELECTRONIC-STRUCTURE OF NI-CU ALLOYS - THE D-ELECTRON CHARGE-DISTRIBUTION, Physical review. B, Condensed matter, 57(24), 1998, pp. 15204-15210
STRUCTURAL AND ELECTRONIC PROPERTY EVOLUTION OF NICKEL AND NICKEL SILICIDE THIN-FILMS ON SI(100) FROM MULTICORE X-RAY-ABSORPTION FINE-STRUCTURE STUDIES
Authors: NAFTEL SJ COULTHARD I SHAM TK DAS SR XU DX
Citation: Sj. Naftel et al., STRUCTURAL AND ELECTRONIC PROPERTY EVOLUTION OF NICKEL AND NICKEL SILICIDE THIN-FILMS ON SI(100) FROM MULTICORE X-RAY-ABSORPTION FINE-STRUCTURE STUDIES, Physical review. B, Condensed matter, 57(15), 1998, pp. 9179-9185
NOVEL PREPARATION OF NOBLE-METAL NANOSTRUCTURES UTILIZING POROUS SILICON
Authors: COULTHARD I SHAM TK
Citation: I. Coulthard et Tk. Sham, NOVEL PREPARATION OF NOBLE-METAL NANOSTRUCTURES UTILIZING POROUS SILICON, Solid state communications, 105(12), 1998, pp. 751-754
M-3,M-2 AND L-3,L-2 XAFS OF AU AND PT NANOPARTICLES ON POROUS SILICON
Authors: COULTHARD I BZOWSKI A SHAM TK HEALD SM KUHN M
Citation: I. Coulthard et al., M-3,M-2 AND L-3,L-2 XAFS OF AU AND PT NANOPARTICLES ON POROUS SILICON, Journal de physique. IV, 7(C2), 1997, pp. 1133-1134
XAFS STUDIES OF TISI2 AND COSI2 THIN-FILMS AT THE TI, CO AND SI K-EDGE
Authors: COULTHARD I SHAM TK SIMARDNORMANDIN M SARAN M GARRETT JD
Citation: I. Coulthard et al., XAFS STUDIES OF TISI2 AND COSI2 THIN-FILMS AT THE TI, CO AND SI K-EDGE, Journal de physique. IV, 7(C2), 1997, pp. 1135-1136
M-3,M-2-EDGE X-RAY-ABSORPTION NEAR-EDGE STRUCTURE OF 5D METALS
Authors: SHAM TK COULTHARD I NAFTEL SJ
Citation: Tk. Sham et al., M-3,M-2-EDGE X-RAY-ABSORPTION NEAR-EDGE STRUCTURE OF 5D METALS, Journal de physique. IV, 7(C2), 1997, pp. 477-479
XAFS OF EARLY 4-D TRANSITION-METAL SILICIDES - 4-D METAL L-3,L-2 EDGEAND SI K-EDGE STUDIES
Authors: COULTHARD I SHAM TK GARRETT JD SMELYANSKY VI TSE JS
Citation: I. Coulthard et al., XAFS OF EARLY 4-D TRANSITION-METAL SILICIDES - 4-D METAL L-3,L-2 EDGEAND SI K-EDGE STUDIES, Journal de physique. IV, 7(C2), 1997, pp. 497-498
SYNCHROTRON-RADIATION CHARACTERIZATION OF METAL SILICIDE THIN-FILMS -SOME OBSERVATIONS
Authors: NAFTEL SJ COULTHARD I SHAM TK XU DX ERICKSON L DAS SR
Citation: Sj. Naftel et al., SYNCHROTRON-RADIATION CHARACTERIZATION OF METAL SILICIDE THIN-FILMS -SOME OBSERVATIONS, Thin solid films, 308, 1997, pp. 580-584
VUV INDUCED LUMINESCENCE FROM POROUS SILICON
Authors: COULTHARD I JIANG DT SHAM TK
Citation: I. Coulthard et al., VUV INDUCED LUMINESCENCE FROM POROUS SILICON, Journal of electron spectroscopy and related phenomena, 79, 1996, pp. 233-236
CHARGE REDISTRIBUTION IN PD-AG ALLOYS FROM A LOCAL PERSPECTIVE
Authors: COULTHARD I SHAM TK
Citation: I. Coulthard et Tk. Sham, CHARGE REDISTRIBUTION IN PD-AG ALLOYS FROM A LOCAL PERSPECTIVE, Physical review letters, 77(23), 1996, pp. 4824-4827
M(3,2)-EDGE X-RAY-ABSORPTION NEAR-EDGE STRUCTURE SPECTROSCOPY - AN ALTERNATIVE PROBE TO THE L(3,2)-EDGE NEAR-EDGE STRUCTURE FOR THE UNOCCUPIED DENSITIES OF D-STATES OF 5D METALS
Authors: SHAM TK NAFTEL SJ COULTHARD I
Citation: Tk. Sham et al., M(3,2)-EDGE X-RAY-ABSORPTION NEAR-EDGE STRUCTURE SPECTROSCOPY - AN ALTERNATIVE PROBE TO THE L(3,2)-EDGE NEAR-EDGE STRUCTURE FOR THE UNOCCUPIED DENSITIES OF D-STATES OF 5D METALS, Journal of applied physics, 79(9), 1996, pp. 7134-7138
XEOL XANES OF ZNS(CU) AND POROUS SI
Authors: JIANG DT FRIGO SP COULTHARD I FENG XH TAN KH SHAM TK ROSENBERG RA
Citation: Dt. Jiang et al., XEOL XANES OF ZNS(CU) AND POROUS SI, Physica. B, Condensed matter, 209(1-4), 1995, pp. 227-228
PHOTOLUMINESCENCE IMAGING OF POROUS SILICON USING A CONFOCAL SCANNINGLASER MACROSCOPE MICROSCOPE
Authors: RIBES AC DAMASKINOS S DIXON AE CARVER GE PENG C FAUCHET PM SHAM TK COULTHARD I
Citation: Ac. Ribes et al., PHOTOLUMINESCENCE IMAGING OF POROUS SILICON USING A CONFOCAL SCANNINGLASER MACROSCOPE MICROSCOPE, Applied physics letters, 66(18), 1995, pp. 2321-2323
REDUCTIVE DEPOSITION OF CU ON POROUS SILICON FROM AQUEOUS-SOLUTIONS -AN X-RAY-ABSORPTION STUDY AT THE CU L3,2-EDGE
Authors: SHAM TK COULTHARD I LORIMER JW HIRAYA A WATANABE M
Citation: Tk. Sham et al., REDUCTIVE DEPOSITION OF CU ON POROUS SILICON FROM AQUEOUS-SOLUTIONS -AN X-RAY-ABSORPTION STUDY AT THE CU L3,2-EDGE, Chemistry of materials, 6(11), 1994, pp. 2085-2091
REDUCTIVE DEPOSITION OF PD ON POROUS SILICON FROM AQUEOUS-SOLUTIONS OF PDCL2 - AN X-RAY-ABSORPTION FINE-STRUCTURE STUDY
Authors: COULTHARD I JIANG DT LORIMER JW SHAM TK FENG XH
Citation: I. Coulthard et al., REDUCTIVE DEPOSITION OF PD ON POROUS SILICON FROM AQUEOUS-SOLUTIONS OF PDCL2 - AN X-RAY-ABSORPTION FINE-STRUCTURE STUDY, Langmuir, 9(12), 1993, pp. 3441-3445
ORIGIN OF LUMINESCENCE FROM POROUS SILICON DEDUCED BY SYNCHROTRON-LIGHT-INDUCED OPTICAL LUMINESCENCE
Authors: SHAM TK JIANG DT COULTHARD I LORIMER JW FENG XH TAN KH FRIGO SP ROSENBERG RA HOUGHTON DC BRYSKIEWICZ B
Citation: Tk. Sham et al., ORIGIN OF LUMINESCENCE FROM POROUS SILICON DEDUCED BY SYNCHROTRON-LIGHT-INDUCED OPTICAL LUMINESCENCE, Nature, 363(6427), 1993, pp. 331-334
OBSERVATIONS ON THE SURFACE AND BULK LUMINESCENCE OF POROUS SILICON
Authors: JIANG DT COULTHARD I SHAM TK LORIMER JW FRIGO SP FENG XH ROSENBERG RA
Citation: Dt. Jiang et al., OBSERVATIONS ON THE SURFACE AND BULK LUMINESCENCE OF POROUS SILICON, Journal of applied physics, 74(10), 1993, pp. 6335-6340
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