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Results: 1-9 |
Results: 9
SINGLE EVENT UPSET (SEU) SENSITIVITY DEPENDENCE OF LINEAR INTEGRATED-CIRCUITS (ICS) ON BIAS CONDITIONS
Authors: KOGA R PENZIN SH CRAWFORD KB CRAIN WR MOSS SC PINKERTON SD LALUMONDIERE SD MAHER MC
Citation: R. Koga et al., SINGLE EVENT UPSET (SEU) SENSITIVITY DEPENDENCE OF LINEAR INTEGRATED-CIRCUITS (ICS) ON BIAS CONDITIONS, IEEE transactions on nuclear science, 44(6), 1997, pp. 2325-2332
SINGLE EVENT EFFECTS IN PULSE-WIDTH MODULATION CONTROLLERS
Authors: PENZIN SH CRAIN WR CRAWFORD KB HANSEL SJ KIRSHMAN JF KOGA R
Citation: Sh. Penzin et al., SINGLE EVENT EFFECTS IN PULSE-WIDTH MODULATION CONTROLLERS, IEEE transactions on nuclear science, 43(6), 1996, pp. 2968-2973
THE RISK OF UTILIZING SEE SENSITIVE COTS DIGITAL SIGNAL PROCESSOR (DSP) DEVICES IN-SPACE
Authors: KOGA R CRAWFORD KB HANSEL SJ CRAIN WR PENZIN SH MILLER SW
Citation: R. Koga et al., THE RISK OF UTILIZING SEE SENSITIVE COTS DIGITAL SIGNAL PROCESSOR (DSP) DEVICES IN-SPACE, IEEE transactions on nuclear science, 43(6), 1996, pp. 2982-2989
SERENDIPITOUS SEU HARDENING OF RESISTIVE LOAD SRAMS
Authors: KOGA R KIRSHMAN JF PINKERTON SD HANSEL SJ CRAWFORD KB CRAIN WR
Citation: R. Koga et al., SERENDIPITOUS SEU HARDENING OF RESISTIVE LOAD SRAMS, IEEE transactions on nuclear science, 43(3), 1996, pp. 931-935
EXPRESSION OF THE MOUSE TESTIS-DETERMINING GENE SRY IN MALE PREIMPLANTATION EMBRYOS
Authors: CAO QP GAUDETTE MF ROBINSON DH CRAIN WR
Citation: Qp. Cao et al., EXPRESSION OF THE MOUSE TESTIS-DETERMINING GENE SRY IN MALE PREIMPLANTATION EMBRYOS, Molecular reproduction and development, 40(2), 1995, pp. 196-204
EXPRESSION OF SGP-1 MESSENGER-RNA IN PREIMPLANTATION MOUSE EMBRYOS
Authors: CAO QP CRAIN WR
Citation: Qp. Cao et Wr. Crain, EXPRESSION OF SGP-1 MESSENGER-RNA IN PREIMPLANTATION MOUSE EMBRYOS, Developmental genetics, 17(3), 1995, pp. 263-271
ION-INDUCED CHARGE COLLECTION AND SEU SENSITIVITY OF EMITTER COUPLED LOGIC (ECL) DEVICES
Authors: KOGA R CRAIN WR HANSEL SJ CRAWFORD KB KIRSHMAN JF PINKERTON SD PENZIN SH MOSS SC MAHER M
Citation: R. Koga et al., ION-INDUCED CHARGE COLLECTION AND SEU SENSITIVITY OF EMITTER COUPLED LOGIC (ECL) DEVICES, IEEE transactions on nuclear science, 42(6), 1995, pp. 1823-1828
CORRELATION OF PICOSECOND LASER-INDUCED LATCHUP AND ENERGETIC PARTICLE-INDUCED LATCHUP IN CMOS TEST STRUCTURES
Authors: MOSS SC LALUMONDIERE SD SCARPULLA JR MACWILLIAMS KP CRAIN WR KOGA R
Citation: Sc. Moss et al., CORRELATION OF PICOSECOND LASER-INDUCED LATCHUP AND ENERGETIC PARTICLE-INDUCED LATCHUP IN CMOS TEST STRUCTURES, IEEE transactions on nuclear science, 42(6), 1995, pp. 1948-1956
OBSERVATION OF SINGLE EVENT UPSETS IN ANALOG MICROCIRCUITS
Authors: KOGA R PINKERTON SD MOSS SC MAYER DC LALUMONDIERE S HANSEL SJ CRAWFORD KB CRAIN WR
Citation: R. Koga et al., OBSERVATION OF SINGLE EVENT UPSETS IN ANALOG MICROCIRCUITS, IEEE transactions on nuclear science, 40(6), 1993, pp. 1838-1844
Risultati: 1-9 |