Authors:
TILLER WA
FRIEDMAN M
SHAW R
CUENDET N
HALICIOGLU T
Citation: Wa. Tiller et al., GROWN-IN POINT-DEFECTS AND MICROSCOPIC DEFECT FORMATION IN CZ SILICON- I - THE ONE-DIMENSIONAL, STEADY-STATE APPROXIMATION, Journal of crystal growth, 186(1-2), 1998, pp. 113-127
Citation: N. Cuendet et al., THE ENERGIES OF MICROVOID FORMATION IN SI AS A FUNCTION OF APPLIED HYDROSTATIC STRESS, Applied physics letters, 69(26), 1996, pp. 4071-4071
Citation: N. Cuendet et al., THE ENERGETICS OF (113) STACKING-FAULT FORMATION IN SI FROM SUPERSATURATED INTERSTITIALS, Applied physics letters, 68(1), 1996, pp. 19-21
Citation: N. Cuendet et al., ENERGETICS OF MICROVOID FORMATION IN SI FROM SUPERSATURATED VACANCIES, Applied physics letters, 67(8), 1995, pp. 1063-1065