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Citation: N. Chaoui et al., Reflectivity of crystalline Ge and Si at the melting temperature measured in real time with subnanosecond temporal resolution, J APPL PHYS, 89(7), 2001, pp. 3763-3767

Authors: Mosbacher, M Chaoui, N Siegel, J Dobler, V Solis, J Boneberg, J Afonso, CN Leiderer, P

Citation: M. Mosbacher et al., A comparison of ns and ps steam laser cleaning of Si surfaces, APPL PHYS A, 69, 1999, pp. S331-S334

Authors: Chaoui, N Millon, E Muller, JF Ecker, P Bieck, W Migeon, HN

Citation: N. Chaoui et al., Perovskite lead titanate PLD thin films: study of oxygen incorporation by O-18 tracing technique, MATER CH PH, 59(2), 1999, pp. 114-119

Authors: Chaoui, N Millon, E Muller, JF Ecker, P Bieck, W Migeon, HN

Citation: N. Chaoui et al., On the role of ambient oxygen in the formation of lead titanate pulsed laser deposition thin films, APPL SURF S, 139, 1999, pp. 256-260

Authors: Chaoui, N Millon, E Muller, JF

Citation: N. Chaoui et al., Heteropolyatomic gas-phase species produced by laser ablation of lead titanate oxide, studied by laser microprobe mass spectrometry, CHEM MATER, 10(12), 1998, pp. 3888-3894