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Citation: R. Buczko et al., Degenerate impurity states in hopping conduction, PHIL MAG B, 81(9), 2001, pp. 965-984

Authors: Kolarova, R Skotnicki, T Chroboczek, JA

Citation: R. Kolarova et al., Low frequency noise in thin gate oxide MOSFETs, MICROEL REL, 41(4), 2001, pp. 579-585

Authors: Pogany, D Chroboczek, JA Ghibaudo, G

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Citation: Ja. Chroboczek et G. Ghibaudo, Low frequency noise in SiGe-base heterojunction bipolar transistors and SiGe-channel metal oxide semiconductor field effect transistors, MICROEL REL, 40(11), 2000, pp. 1897-1903

Authors: Llinares, P Ghibaudo, G Mourier, Y Gambetta, N Laurens, F Chroboczek, JA

Citation: P. Llinares et al., Determination of base and emitter resistances in bipolar junction transistors from low frequency noise and static measurements, IEICE TR EL, E82C(4), 1999, pp. 607-611

Authors: Jouan, S Planche, R Baudry, H Ribot, P Chroboczek, JA Dutartre, D Gloria, D Laurens, M Llinares, P Marty, M Monroy, A Morin, C Pantel, R Perrotin, A de Pontcharra, J Regolini, JL Vincent, G Chantre, A

Citation: S. Jouan et al., A high-speed low 1/f noise SiGeHBT technology using epitaxially-aligned polysilicon emitters, IEEE DEVICE, 46(7), 1999, pp. 1525-1531